Inventor · disambiguated record
Katsuhiro Suma
Also filed as: SUMA KATSUHIRO
23 granted patents·2 pending applications·938 citations·filing 1992–2007
97Inventor score
Top patents by PatentIndex Score
25 records- 0197US6018172ASemiconductor memory device including memory cell transistors formed on SOI substrate and having fixed body regionsMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 25, 2000·234 cites·31 claims
- 0296US6384445B1Semiconductor memory device including memory cell transistors formed on SOI substrate and having fixed body regionsMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 7, 2002·179 cites·22 claims
- 0393US5652725ASemiconductor memory device having a redundant row and a redundant column which can be accessed prior to substitutionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 29, 1997·112 cites·7 claims
- 0485USRE36089EColumn selecting circuit in semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 9, 1999·52 cites·14 claims
- 0584US6288949B1Semiconductor memory device including an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 11, 2001·20 cites·10 claims
- 0683US5825696ASemiconductor memory device including an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Oct 20, 1998·33 cites·9 claims
- 0781US7138684B2Semiconductor memory device including an SOI substrateRENESAS TECH CORP·Filed 2004·Granted Nov 21, 2006·15 cites·2 claims
- 0880US6385159B2Semiconductor memory device including an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 2001·Granted May 7, 2002·14 cites·4 claims
- 0979US5635744ASemiconductor memory and semiconductor device having SOI structureMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jun 3, 1997·52 cites·22 claims
- 1077US6586803B2Semiconductor device using an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jul 1, 2003·31 cites·9 claims
- 1175US6768662B2Semiconductor memory device including an SOI substrateRENESAS TECH CORP·Filed 2003·Granted Jul 27, 2004·10 cites·2 claims
- 1273US5793685ASemiconductor memory device capable of simultaneously designating multibit test mode and special test modeMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Aug 11, 1998·34 cites·20 claims
- 1371US7242060B2Semiconductor memory device including an SOI substrateRENESAS TECH CORP·Filed 2006·Granted Jul 10, 2007·2 cites·1 claims
- 1471US6577522B2Semiconductor memory device including an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jun 10, 2003·8 cites·6 claims
- 1570US5770964AArrangement enabling pin contact test of a semiconductor device having clamp protection circuit, and method of testing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 23, 1998·38 cites·20 claims
- 1669US6787853B2Semiconductor device using an SOI substrateRENESAS TECH CORP·Filed 2003·Granted Sep 7, 2004·11 cites·4 claims
- 1767US5982005ASemiconductor device using an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Nov 9, 1999·20 cites·15 claims
- 1864US5315548AColumn selecting circuit in semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1992·Granted May 24, 1994·20 cites·12 claims
- 1963US6091647ASemiconductor memory device including an SOI substrateMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 18, 2000·11 cites·9 claims
- 2059US5400290ASemiconductor device allowing accurate characteristics testMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Mar 21, 1995·19 cites·20 claims
- 2153US2007257313A1Semiconductor memory device including an SOI substrateRENESAS TECH CORP·Filed 2007·Application pending·0 cites
- 2252US2007052028A1Semiconductor memory device including an SOI substrateRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 2347US6060738ASemiconductor device having SOI structureMITSUBISHI ELECTRIC CORP·Filed 1995·Granted May 9, 2000·11 cites·14 claims
- 2442US5512501AMethod of manufacturing a semiconductor device having an SOI structureMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Apr 30, 1996·7 cites·15 claims
- 2532US6215141B1Semiconductor device including a transistor having portions of source and drain regions removed by the same amountMITSUBHISHI DENKI K K·Filed 1996·Granted Apr 10, 2001·5 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →