Inventor · disambiguated record
Kazuhiro Tashiro
Also filed as: TASHIRO KAZUHIRO
37 granted patents·4 pending applications·496 citations·filing 1994–2019
98Inventor score
Files withFUJITSU LTD21FUJITSU SEMICONDUCTOR LTD5TASHIRO KAZUHIRO3NAVITIME JAPAN CO LTD2TOSHIBA MACHINE CO LTD2
Top patents by PatentIndex Score
41 records- 0196USD544876SImage for a portable phoneNAVITIME JAPAN CO LTD·Filed 2005·Granted Jun 19, 2007·86 cites·1 claims
- 0294US6927343B2Contactor for testing miniaturized devices and componentsFUJITSU LTD·Filed 2002·Granted Aug 9, 2005·72 cites·32 claims
- 0393US7129726B2Testing device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2005·Granted Oct 31, 2006·26 cites·15 claims
- 0493US6661247B2Semiconductor testing deviceFUJITSU LTD·Filed 2001·Granted Dec 9, 2003·41 cites·14 claims
- 0589US7112889B1Semiconductor device having an alignment mark formed by the same material with a metal postFUJITSU LTD·Filed 2000·Granted Sep 26, 2006·36 cites·9 claims
- 0684US8797055B2Prober and method of inspecting semiconductor chipTASHIRO KAZUHIRO·Filed 2011·Granted Aug 5, 2014·6 cites·7 claims
- 0784US6767219B2Contactor, method for manufacturing such contactor, and testing method using such contactorFUJITSU LTD·Filed 2002·Granted Jul 27, 2004·30 cites·34 claims
- 0881US7430798B2Electronic component attaching toolFUJITSU LTD·Filed 2005·Granted Oct 7, 2008·10 cites·20 claims
- 0980US6249135B1Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltageFUJITSU LTD·Filed 1999·Granted Jun 19, 2001·34 cites·3 claims
- 1079US8268670B2Method of semiconductor device protectionTASHIRO KAZUHIRO·Filed 2011·Granted Sep 18, 2012·4 cites·2 claims
- 1179US7915720B2Semiconductor integrated circuit device and test method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Mar 29, 2011·11 cites·18 claims
- 1274US7145250B2LSI package, LSI element testing method, and semiconductor device manufacturing methodFUJITSU LTD·Filed 2005·Granted Dec 5, 2006·6 cites·20 claims
- 1373US5595693AMethod for automatically setting injection molding speed condition in injection molding machineTOSHIBA MACHINE CO LTD·Filed 1994·Granted Jan 21, 1997·35 cites·6 claims
- 1472US8051554B2IC socket with attached electronic componentFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Nov 8, 2011·3 cites·2 claims
- 1571US8759119B2Method of testing a semiconductor device and suctioning a semiconductor device in the wafer stateFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Jun 24, 2014·2 cites·4 claims
- 1668USD565057SImage for a portable phoneNAVITIME JAPAN CO LTD·Filed 2005·Granted Mar 25, 2008·16 cites·1 claims
- 1768US7161370B2Semiconductor testing deviceFUJITSU LTD·Filed 2005·Granted Jan 9, 2007·2 cites·1 claims
- 1866US7825676B2Contactor and test method using contactorFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Nov 2, 2010·5 cites·17 claims
- 1966US7807481B2Method of semiconductor device protection, package of semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Oct 5, 2010·2 cites·3 claims
- 2066US7518388B2Contactor for electronic components and test method using the sameFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Apr 14, 2009·4 cites·13 claims
- 2163US7309996B2Contactor for electronic components and test method using the sameFUJITSU LTD·Filed 2004·Granted Dec 18, 2007·9 cites·3 claims
- 2262US6924174B2Method of attaching electronic component and electronic component attaching toolFUJITSU LTD·Filed 2003·Granted Aug 2, 2005·7 cites·9 claims
- 2361US7382046B2Semiconductor device protection cover, and semiconductor device unit including the coverFUJITSU LTD·Filed 2004·Granted Jun 3, 2008·7 cites·16 claims
- 2460US8671557B2Tray in combination with electronic component attaching tool attached to the trayKOIZUMI DAISUKE·Filed 2011·Granted Mar 18, 2014·1 cites·3 claims
- 2560US6882169B2Semiconductor testing deviceFUJITSU LTD·Filed 2003·Granted Apr 19, 2005·6 cites·5 claims
- 2657US7355421B2Semiconductor apparatus testing arrangement and semiconductor apparatus testing methodFUJITSU LTD·Filed 2006·Granted Apr 8, 2008·2 cites·3 claims
- 2755US10882393B2Fuel supply deviceTOYOTA MOTOR CO LTD·Filed 2019·Granted Jan 5, 2021·0 cites·4 claims
- 2853US11072236B2Fuel supply deviceTOYOTA MOTOR CO LTD·Filed 2018·Granted Jul 27, 2021·0 cites·7 claims
- 2953US8404496B2Method of testing a semiconductor device and suctioning a semiconductor device in the wafer stateMARUYAMA SHIGEYUKI·Filed 2006·Granted Mar 26, 2013·1 cites·2 claims
- 3052US7403024B2Contactor having contact electrodes of metal springs embedded in a plate-like structureFUJITSU LTD·Filed 2004·Granted Jul 22, 2008·4 cites·3 claims
- 3151US5597588ABarrel temperature control system for injection molding machineTOSHIBA MACHINE CO LTD·Filed 1995·Granted Jan 28, 1997·16 cites·4 claims
- 3249US8164181B2Semiconductor device packaging structureTASHIRO KAZUHIRO·Filed 2010·Granted Apr 24, 2012·0 cites·2 claims
- 3349US2008227226A1Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2008·Application pending·0 cites
- 3444US6203332B1Attachment structure of semiconductor device socketFUJITSU LTD·Filed 1999·Granted Mar 20, 2001·10 cites·11 claims
- 3544US2006097356A1Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor deviceFUJITSU LTD·Filed 2005·Application pending·0 cites
- 3642US2008114534A1Navigation System And Portable TerminalNAVIGATION SYSTEM AND PORTABLE·Filed 2005·Application pending·0 cites
- 3742US2003150348A1Initiator and gas generatorTAKATA CORP·Filed 2002·Application pending·0 cites
- 3841US8159250B2Testing device for testing a semiconductor deviceMARUYAMA YUJI·Filed 2009·Granted Apr 17, 2012·0 cites·6 claims
- 3938US7199600B2Semiconductor device testing method and testing equipmentFUJITSU LTD·Filed 2005·Granted Apr 3, 2007·0 cites·8 claims
- 4030US5763297AIntegrated circuit carrier having lead-socket array with various inner dimensionsFUJITSU LTD·Filed 1996·Granted Jun 9, 1998·1 cites·10 claims
- 4130US5668407AIntegrated circuit carrier having lead-socket array with various inner dimensionsFUJITSU LTD·Filed 1996·Granted Sep 16, 1997·1 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →