Inventor · disambiguated record
Katsuo Yasuta
Also filed as: YASUTA KATSUO
7 granted patents·1 pending application·13 citations·filing 2008–2025
77Inventor score
Top patents by PatentIndex Score
8 records- 0175US9069008B2Inspection apparatus for semiconductor devices and chuck stage for the inspection apparatus that is movable with respect to the front and back side electrodesNIHON MICRONICS KK·Filed 2012·Granted Jun 30, 2015·5 cites·9 claims
- 0266US2025383372A1Inspection ApparatusNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 0363US8278965B2Inspection apparatusWASHIO KENICHI·Filed 2010·Granted Oct 2, 2012·3 cites·6 claims
- 0454US8471586B2Wafer prober for semiconductor inspection and inspection methodWASHIO KENICHI·Filed 2010·Granted Jun 25, 2013·1 cites·10 claims
- 0554US7719300B2Method for testing a semiconductor wafer and apparatus thereofNIHON MICRONICS KK·Filed 2008·Granted May 18, 2010·3 cites·7 claims
- 0653US9146256B2Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling deviceNIHON MICRONICS KK·Filed 2012·Granted Sep 29, 2015·1 cites·9 claims
- 0733US11428727B2ProberNIHON MICRONICS KK·Filed 2019·Granted Aug 30, 2022·0 cites·10 claims
- 0831US9097761B2Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatusYASUTA KATSUO·Filed 2011·Granted Aug 4, 2015·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →