Inventor · disambiguated record
Kazushi Yoshimura
Also filed as: YOSHIMURA KAZUSHI
14 granted patents·769 citations·filing 1983–2011
95Inventor score
Top patents by PatentIndex Score
14 records- 0199US6172363B1Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 1997·Granted Jan 9, 2001·185 cites·20 claims
- 0297US6329826B1Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2000·Granted Dec 11, 2001·95 cites·4 claims
- 0396US7417444B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2005·Granted Aug 26, 2008·25 cites·7 claims
- 0492US5883437AMethod and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereofHITACHI LTD·Filed 1995·Granted Mar 16, 1999·175 cites·13 claims
- 0590US7952074B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2008·Granted May 31, 2011·8 cites·18 claims
- 0688US4772125AApparatus and method for inspecting soldered portionsHITACHI LTD·Filed 1986·Granted Sep 20, 1988·82 cites·6 claims
- 0785US6559663B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2001·Granted May 6, 2003·20 cites·10 claims
- 0884US7026830B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2003·Granted Apr 11, 2006·19 cites·6 claims
- 0984US5781294AMethod and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimenHITACHI LTD·Filed 1995·Granted Jul 14, 1998·77 cites·25 claims
- 1071US8035058B2Apparatus for repairing circuit pattern and method for manufacturing display apparatus using the sameHITACHI DISPLAYS LTD·Filed 2005·Granted Oct 11, 2011·6 cites·11 claims
- 1167US6831998B1Inspection system for circuit patterns and a method thereofHITACHI LTD·Filed 2000·Granted Dec 14, 2004·26 cites·8 claims
- 1265US5301248AMethod for pattern inspection and apparatus thereforHITACHI LTD·Filed 1992·Granted Apr 5, 1994·40 cites·39 claims
- 1364US4556797AMethod and apparatus for detecting edge of fine pattern on specimenHITACHI LTD·Filed 1983·Granted Dec 3, 1985·11 cites·3 claims
- 1449US9134279B2Internal defect inspection method and apparatus for the sameNAKATA TOSHIHIKO·Filed 2011·Granted Sep 15, 2015·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →