Inventor · disambiguated record
Ken Cheong Cheah
Also filed as: CHEAH KEN · CHEAH KEN C · CHEAH KEN CHEONG
17 granted patents·1 pending application·507 citations·filing 2000–2017
95Inventor score
Top patents by PatentIndex Score
18 records- 0197US10026486B1First read countermeasures in memorySANDISK TECHNOLOGIES LLC·Filed 2017·Granted Jul 17, 2018·49 cites·16 claims
- 0295US6631086B1On-chip repair of defective address of core flash memory cellsADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 7, 2003·111 cites·20 claims
- 0394US7010736B1Address sequencer within BIST (Built-in-Self-Test) systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 7, 2006·106 cites·28 claims
- 0492US10229744B2First read countermeasures in memorySANDISK TECHNOLOGIES LLC·Filed 2017·Granted Mar 12, 2019·11 cites·19 claims
- 0589US6665214B1On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) modeADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 16, 2003·58 cites·18 claims
- 0683US7028240B1Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machineADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 11, 2006·34 cites·24 claims
- 0783US6707718B1Generation of margining voltage on-chip during testing CAM portion of flash memory deviceADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 16, 2004·40 cites·25 claims
- 0877US7284167B2Automated tests for built-in self testSPANSION LLC·Filed 2005·Granted Oct 16, 2007·11 cites·47 claims
- 0977US6243291B1Two-stage pipeline sensing for page mode flash memoryADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 5, 2001·25 cites·14 claims
- 1069US7672803B1Input of test conditions and output generation for built-in self testSPANSION LLC·Filed 2004·Granted Mar 2, 2010·14 cites·34 claims
- 1166US6891752B1System and method for erase voltage control during multiple sector erase of a flash memory deviceADVANCED MICRO DEVICES INC·Filed 2002·Granted May 10, 2005·15 cites·20 claims
- 1259US7415646B1Page—EXE erase algorithm for flash memorySPANSION LLC·Filed 2004·Granted Aug 19, 2008·10 cites·40 claims
- 1358US7158442B1Flexible latency in flash memorySPANSION LLC·Filed 2005·Granted Jan 2, 2007·5 cites·15 claims
- 1453US6973003B1Memory device and methodADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 6, 2005·8 cites·24 claims
- 1550US6980473B1Memory device and methodADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 27, 2005·6 cites·14 claims
- 1646US6970368B1CAM (content addressable memory) cells as part of core array in flash memory deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 29, 2005·4 cites·35 claims
- 1737US6771093B1Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductorADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 3, 2004·0 cites·21 claims
- 1830US2004049724A1Built-in-self-test (BIST) of flash memory cells and implementation of BIST interfaceFiled 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ken Cheong Cheah files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →