Inventor · disambiguated record
Kevin G. Duesman
Also filed as: DUESMAN KEVIN · DUESMAN KEVIN G
142 granted patents·10 pending applications·4,492 citations·filing 1989–2021
99Inventor score
Files withMICRON TECHNOLOGY INC134MICRON SEMICONDUCTOR INC3FARNWORTH WARREN M2BEIGEL KURT D1INTEL CORP1
Top patents by PatentIndex Score
152 records- 0198US6794699B2Annular gate and technique for fabricating an annular gateMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 21, 2004·172 cites·107 claims
- 0298US6515325B1Nanotube semiconductor devices and methods for making the sameMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 4, 2003·175 cites·14 claims
- 0397US6858891B2Nanotube semiconductor devices and methods for making the sameMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 22, 2005·124 cites·24 claims
- 0497US5347179AInverting output driver circuit for reducing electron injection into the substrateMICRON SEMICONDUCTOR INC·Filed 1993·Granted Sep 13, 1994·115 cites·20 claims
- 0597US5110754AMethod of making a DRAM capacitor for use as an programmable antifuse for redundancy repair/options on a DRAMMICRON TECHNOLOGY INC·Filed 1991·Granted May 5, 1992·226 cites·12 claims
- 0696US6562278B1Methods of fabricating housing structures and micromachines incorporating such structuresMICRON TECHNOLOGY INC·Filed 2000·Granted May 13, 2003·91 cites·30 claims
- 0796US6482576B1Surface smoothing of stereolithographically formed 3-D objectsMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 19, 2002·116 cites·19 claims
- 0895US10128229B1Semiconductor devices with package-level configurabilityMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 13, 2018·12 cites·8 claims
- 0995US6731528B2Dual write cycle programmable conductor memory system and method of operationMICRON TECHNOLOGY INC·Filed 2002·Granted May 4, 2004·116 cites·42 claims
- 1095US6605956B2Device and method for testing integrated circuit dice in an integrated circuit moduleMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 12, 2003·70 cites·17 claims
- 1195US6417695B1Antifuse reroute of diesMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 9, 2002·71 cites·62 claims
- 1294US10483241B1Semiconductor devices with through silicon vias and package-level configurabilityMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 19, 2019·13 cites·21 claims
- 1394US5977763ACircuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 2, 1999·101 cites·12 claims
- 1494US5324681AMethod of making a 3-dimensional programmable antifuse for integrated circuitsMICRON TECHNOLOGY INC·Filed 1993·Granted Jun 28, 1994·144 cites·11 claims
- 1593US7205598B2Random access memory device utilizing a vertically oriented select transistorMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 17, 2007·60 cites·32 claims
- 1693US5824569ASemiconductor device having ball-bonded padsMICRON TECHNOLOGY INC·Filed 1996·Granted Oct 20, 1998·123 cites·20 claims
- 1793US5301143AMethod for identifying a semiconductor die using an IC with programmable linksMICRON SEMICONDUCTOR INC·Filed 1992·Granted Apr 5, 1994·183 cites·19 claims
- 1892US10312232B1Semiconductor devices with package-level configurabilityMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 4, 2019·6 cites·8 claims
- 1992US6544465B1Method for forming three dimensional structures from liquid with improved surface finishMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 8, 2003·32 cites·28 claims
- 2092US6088282ASystem and method for an antifuse bankMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 11, 2000·65 cites·21 claims
- 2191US7777264B2Random access memory device utilizing a vertically oriented select transistorMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 17, 2010·15 cites·28 claims
- 2291US5724282ASystem and method for an antifuse bankMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 3, 1998·66 cites·12 claims
- 2391US5266821AChip decoupling capacitorMICRON TECHNOLOGY INC·Filed 1992·Granted Nov 30, 1993·99 cites·25 claims
- 2491US5059899ASemiconductor dies and wafers and methods for makingMICRON TECHNOLOGY INC·Filed 1990·Granted Oct 22, 1991·300 cites·22 claims
- 2590US5032892ADepletion mode chip decoupling capacitorMICRON TECHNOLOGY INC·Filed 1989·Granted Jul 16, 1991·68 cites·39 claims
- 2689US6709795B2Stereolithographically packaged, in-process semiconductor dieMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 23, 2004·20 cites·4 claims
- 2789US5214657AMethod for fabricating wafer-scale integration wafers and method for utilizing defective wafer-scale integration wafersMICRON TECHNOLOGY INC·Filed 1992·Granted May 25, 1993·133 cites·40 claims
- 2888US6740476B2Surface smoothing of stereolithographically formed 3-D objectsMICRON TECHNOLOGY INC·Filed 2002·Granted May 25, 2004·19 cites·13 claims
- 2987US10283462B1Semiconductor devices with post-probe configurabilityMICRON TECHNOLOGY INC·Filed 2017·Granted May 7, 2019·4 cites·10 claims
- 3087US6954385B2Method and apparatus for sensing resistive memory stateMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 11, 2005·34 cites·37 claims
- 3187US6797545B2Method and apparatus for fabricating electronic deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 28, 2004·27 cites·9 claims
- 3287US6319756B2Heat sink for chip stacking applicationsMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 20, 2001·38 cites·25 claims
- 3387US6043564ASemiconductor device having ball-bonded padsMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 28, 2000·67 cites·27 claims
- 3486US6632343B1Method and apparatus for electrolytic plating of surface metalsMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 14, 2003·30 cites·5 claims
- 3586US5825697ACircuit and method for enabling a function in a multiple memory device moduleMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 20, 1998·56 cites·57 claims
- 3686US5796746ADevice and method for testing integrated circuit dice in an integrated circuit moduleMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 18, 1998·81 cites·109 claims
- 3786US5307309AMemory module having on-chip surge capacitorsMICRON TECHNOLOGY INC·Filed 1993·Granted Apr 26, 1994·76 cites·19 claims
- 3885US7034560B2Device and method for testing integrated circuit dice in an integrated circuit moduleMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 25, 2006·20 cites·12 claims
- 3985US6031727APrinted circuit board with integrated heat sinkMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 29, 2000·61 cites·53 claims
- 4084US6466053B2Antifuse reroute of diesMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 15, 2002·26 cites·28 claims
- 4184US6078100AUtilization of die repattern layers for die internal connectionsMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 20, 2000·46 cites·6 claims
- 4284US5953216AMethod and apparatus for replacing a defective integrated circuit deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 14, 1999·52 cites·65 claims
- 4383US10580767B2Semiconductor devices with package-level configurabilityMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 3, 2020·2 cites·14 claims
- 4483US6841438B2Annular gate and technique for fabricating an annular gateMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 11, 2005·27 cites·27 claims
- 4583US5986409AFlat panel display and method of its manufactureMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 16, 1999·39 cites·83 claims
- 4683US5245577AIntegrated circuit two-cycle test mode activation circuitMICRON TECHNOLOGY INC·Filed 1990·Granted Sep 14, 1993·52 cites·18 claims
- 4782US6356474B1Efficient open-array memory device architecture and methodMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 12, 2002·31 cites·54 claims
- 4881US6633183B2Antifuse reroute of diesMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 14, 2003·21 cites·60 claims
- 4981US6240535B1Device and method for testing integrated circuit dice in an integrated circuit moduleMICRON TECHNOLOGY INC·Filed 1998·Granted May 29, 2001·40 cites·17 claims
- 5080US7081385B2Nanotube semiconductor devices and methods for making the sameMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 25, 2006·21 cites·27 claims
Showing the top 50 of 152 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →