Inventor · disambiguated record
Kevin W. Gorman
Also filed as: GORMAN KEVIN W · GORMAN KEVIN WILLIAM
37 granted patents·2 pending applications·193 citations·filing 2004–2023
97Inventor score
Top patents by PatentIndex Score
39 records- 0194US12266415B1Reliable electronic fuse based storage using error correction codingMARVELL ASIA PTE LTD·Filed 2023·Granted Apr 1, 2025·4 cites·18 claims
- 0294US8719648B2Interleaving of memory repair data compression and fuse programming operations in single fusebay architectureGORMAN KEVIN W·Filed 2011·Granted May 6, 2014·35 cites·24 claims
- 0393US8484543B2Fusebay controller structure, system, and methodANAND DARREN L·Filed 2011·Granted Jul 9, 2013·28 cites·20 claims
- 0487US7458000B2Automatic shutdown or throttling of a bist state machine using thermal feedbackIBM·Filed 2006·Granted Nov 25, 2008·20 cites·19 claims
- 0585US10650906B2Memory bypass function for a memorySYNOPSYS INC·Filed 2018·Granted May 12, 2020·5 cites·21 claims
- 0682US8935586B2Staggered start of BIST controllers and BIST enginesIBM·Filed 2012·Granted Jan 13, 2015·6 cites·24 claims
- 0781US7607060B2System and method for performing high speed memory diagnostics via built-in-self-testIBM·Filed 2006·Granted Oct 20, 2009·13 cites·20 claims
- 0879US8914688B2System and method of reducing test time via address aware BIST circuitryIBM·Filed 2012·Granted Dec 16, 2014·8 cites·25 claims
- 0978US11017873B2Memory bypass function for a memorySYNOPSYS INC·Filed 2020·Granted May 25, 2021·1 cites·20 claims
- 1078US7870454B2Structure for system for and method of performing high speed memory diagnostics via built-in-self-testIBM·Filed 2008·Granted Jan 11, 2011·9 cites·8 claims
- 1176US7735031B2Method and apparatus for self identification of circuitryIBM·Filed 2007·Granted Jun 8, 2010·8 cites·17 claims
- 1272US8839054B2Read only memory (ROM) with redundancyBRACERAS GEORGE M·Filed 2012·Granted Sep 16, 2014·4 cites·13 claims
- 1372US8467260B2Structure and method for storing multiple repair pass data into a fusebayGORMAN KEVIN W·Filed 2011·Granted Jun 18, 2013·5 cites·20 claims
- 1471US9460811B2Read only memory (ROM) with redundancyIBM·Filed 2014·Granted Oct 4, 2016·2 cites·8 claims
- 1570US8612813B2Circuit and method for efficient memory repairIBM·Filed 2013·Granted Dec 17, 2013·3 cites·14 claims
- 1667US9734920B2Memory test with in-line error correction code logic to test memory data and test the error correction code logic surrounding the memoriesIBM·Filed 2015·Granted Aug 15, 2017·2 cites·17 claims
- 1767US7954028B2Structure for redundancy programming of a memory deviceIBM·Filed 2008·Granted May 31, 2011·6 cites·9 claims
- 1865US9799413B2Multi-domain fuse managementINVECAS INC·Filed 2016·Granted Oct 24, 2017·2 cites·19 claims
- 1964US9946620B2Memory built-in self test systemINVECAS INC·Filed 2016·Granted Apr 17, 2018·2 cites·18 claims
- 2063US9172373B2Verifying partial good voltage island structuresIBM·Filed 2013·Granted Oct 27, 2015·1 cites·19 claims
- 2161US7757141B2Automatically extensible addressing for shared array built-in self-test (ABIST) circuitryIBM·Filed 2008·Granted Jul 13, 2010·3 cites·7 claims
- 2261US7702975B2Integration of LBIST into array BISR flowIBM·Filed 2008·Granted Apr 20, 2010·3 cites·21 claims
- 2360US7689887B2Automatic shutdown or throttling of a BIST state machine using thermal feedbackIBM·Filed 2007·Granted Mar 30, 2010·4 cites·4 claims
- 2456US7194670B2Command multiplier for built-in-self-testIBM·Filed 2004·Granted Mar 20, 2007·9 cites·8 claims
- 2554US8570820B2Selectable repair pass maskingGORMAN KEVIN WILLIAM·Filed 2011·Granted Oct 29, 2013·2 cites·20 claims
- 2654US8381052B2Circuit and method for efficient memory repairIBM·Filed 2009·Granted Feb 19, 2013·2 cites·21 claims
- 2753US8917566B2Bypass structure for a memory device and method to reduce unknown test valuesCUMMINGS AARON J·Filed 2012·Granted Dec 23, 2014·2 cites·20 claims
- 2850US7549098B2Redundancy programming for a memory deviceIBM·Filed 2006·Granted Jun 16, 2009·2 cites·8 claims
- 2948US10622090B2Arbitration for memory diagnosticsIBM·Filed 2018·Granted Apr 14, 2020·0 cites·20 claims
- 3048US7702976B2Integration of LBIST into array BISR flowIBM·Filed 2008·Granted Apr 20, 2010·2 cites·19 claims
- 3143US9224503B2Memory test with in-line error correction code logicIBM·Filed 2012·Granted Dec 29, 2015·0 cites·20 claims
- 3241US10153055B2Arbitration for memory diagnosticsIBM·Filed 2015·Granted Dec 11, 2018·0 cites·20 claims
- 3339US7937632B2Design structure and apparatus for a robust embedded interfaceIBM·Filed 2008·Granted May 3, 2011·0 cites·15 claims
- 3438US9773570B2Built-in-self-test (BIST) test time reductionIBM·Filed 2013·Granted Sep 26, 2017·0 cites·9 claims
- 3538US9514844B2Fast auto shift of failing memory diagnostics data using pattern detectionIBM·Filed 2014·Granted Dec 6, 2016·0 cites·16 claims
- 3637US2011029827A1Method, apparatus, and design structure for built-in self-testIBM·Filed 2009·Application pending·0 cites
- 3737US2006259840A1Self-test circuitry to determine minimum operating voltageIBM·Filed 2005·Application pending·0 cites
- 3836US9865361B2Diagnostics for a memory deviceINVECAS INC·Filed 2016·Granted Jan 9, 2018·0 cites·22 claims
- 3933US8239715B2Method and apparatus for a robust embedded interfaceEUSTIS STEVEN M·Filed 2008·Granted Aug 7, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →