Inventor · disambiguated record
Kee Yun Han
Also filed as: HAN KEE-YUN
6 granted patents·5 citations·filing 2014–2017
70Inventor score
Top patents by PatentIndex Score
6 records- 0179US11389922B2Polishing measurement device and abrasion time controlling method thereof, and polishing control system including sameSK SILTRON CO LTD·Filed 2017·Granted Jul 19, 2022·2 cites·17 claims
- 0271US10062574B2Wafer polishing apparatus and methodSK SILTRON CO LTD·Filed 2015·Granted Aug 28, 2018·2 cites·7 claims
- 0362US9724800B2Wafer polishing apparatusLG SILTRON INC·Filed 2015·Granted Aug 8, 2017·1 cites·18 claims
- 0452US9358666B2Slurry supply device and polishing apparatus including the sameLG SILTRON INC·Filed 2014·Granted Jun 7, 2016·0 cites·20 claims
- 0534US9744641B2Wafer polishing apparatusLG SILTRON INC·Filed 2015·Granted Aug 29, 2017·0 cites·17 claims
- 0629US10255669B2Defect measuring device for wafersLG SILTRON INC·Filed 2015·Granted Apr 9, 2019·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →