Inventor · disambiguated record
Kenya Iwasaki
Also filed as: IWASAKI KENYA
9 granted patents·2 pending applications·65 citations·filing 2005–2020
85Inventor score
Top patents by PatentIndex Score
11 records- 0190US7769617B2Worker management system, worker management apparatus and worker management methodTOKYO ELECTRON LTD·Filed 2005·Granted Aug 3, 2010·31 cites·4 claims
- 0285US7622392B2Method of processing substrate, method of manufacturing solid-state imaging device, method of manufacturing thin film device, and programs for implementing the methodsTOKYO ELECTRON LTD·Filed 2006·Granted Nov 24, 2009·11 cites·12 claims
- 0385US7510972B2Method of processing substrate, post-chemical mechanical polishing cleaning method, and method of and program for manufacturing electronic deviceTOKYO ELECTRON LTD·Filed 2006·Granted Mar 31, 2009·11 cites·18 claims
- 0476US7682517B2Method of processing substrate, and method of and program for manufacturing electronic deviceTOKYO ELECTRON LTD·Filed 2006·Granted Mar 23, 2010·9 cites·12 claims
- 0574US8658436B2Method for separating and transferring IC chipsYAMADA MASAHIRO·Filed 2011·Granted Feb 25, 2014·2 cites·3 claims
- 0670US8841141B2Method for separating and transferring IC chipsTOKYO ELECTRON LTD·Filed 2014·Granted Sep 23, 2014·1 cites·2 claims
- 0760US9196539B2Method for separating and transferring IC chipsTOKYO ELECTRON LTD·Filed 2014·Granted Nov 24, 2015·0 cites·9 claims
- 0856US9318387B2Method for separating and transferring IC chipsTOKYO ELECTRON LTD·Filed 2015·Granted Apr 19, 2016·0 cites·9 claims
- 0954US11035741B2Temperature measurement substrate and temperature measurement systemTOKYO ELECTRON LTD·Filed 2017·Granted Jun 15, 2021·0 cites·15 claims
- 1047US2015158242A1Imprint device and templateTOKYO ELECTRON LTD·Filed 2013·Application pending·0 cites
- 1145US2021143044A1Plasma processing apparatusTOKYO ELECTRON LTD·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →