Inventor · disambiguated record
Kenneth W. Johnson
Also filed as: JOHNSON KENNETH · JOHNSON KENNETH W · JOHNSON KENNETH WILLIAM
28 granted patents·6 pending applications·488 citations·filing 1975–2016
97Inventor score
Files withAGILENT TECHNOLOGIES INC14JOHNSON KENNETH W5KEYSIGHT TECHNOLOGIES INC5LECROY CORP4HEWLETT PACKARD CO3
Top patents by PatentIndex Score
34 records- 0197US7025628B2Electronic probe extenderAGILENT TECHNOLOGIES INC·Filed 2003·Granted Apr 11, 2006·137 cites·12 claims
- 0286US7046020B2Probes with perpendicularly disposed spring pins, and methods of making and using sameAGILENT TECHNOLOGIES INC·Filed 2004·Granted May 16, 2006·34 cites·16 claims
- 0384US9316669B2Measurement probe providing different levels of amplification for signals of different magnitudeKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Apr 19, 2016·5 cites·21 claims
- 0484US7965764B2Simultaneous physical and protocol layer analysisLECROY CORP·Filed 2010·Granted Jun 21, 2011·5 cites·13 claims
- 0584US6144559AProcess for assembling an interposer to probe dense pad arraysAGILENT TECHNOLOGIES INC·Filed 1999·Granted Nov 7, 2000·93 cites·12 claims
- 0683US9188606B2Oscilloscope current probe with interchangeable range and sensitivity setting modulesKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Nov 17, 2015·5 cites·31 claims
- 0782US9671427B2Dual output high voltage active probe with output clamping and associated methodsKEYSIGHT TECHNOLOGIES INC·Filed 2016·Granted Jun 6, 2017·4 cites·20 claims
- 0880US9459290B2Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveformsKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Oct 4, 2016·4 cites·20 claims
- 0979USD556066SHousing for oscilloscopeLECROY CORP·Filed 2006·Granted Nov 27, 2007·33 cites·1 claims
- 1077US7403560B2Simultaneous physical and protocol layer analysisLECROY CORP·Filed 2004·Granted Jul 22, 2008·20 cites·44 claims
- 1175US9304150B2Closed core current probeJOHNSON KENNETH W·Filed 2011·Granted Apr 5, 2016·3 cites·16 claims
- 1272US6980015B2Back side probing method and assemblyAGILENT TECHNOLOGIES INC·Filed 2003·Granted Dec 27, 2005·15 cites·9 claims
- 1371US7756199B2Simultaneous physical and protocol layer analysisLECROY CORP·Filed 2008·Granted Jul 13, 2010·5 cites·2 claims
- 1469US9423422B2Oscilloscope probe having output clamping circuitKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Aug 23, 2016·2 cites·20 claims
- 1568US7242203B2Probe retention kit, and system and method for probing a pattern of points on a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jul 10, 2007·13 cites·7 claims
- 1661US7371093B1ZIF connection accessory and ZIF browser for an electronic probeAGILENT TECHNOLOGIES INC·Filed 2006·Granted May 13, 2008·7 cites·17 claims
- 1761US7338292B2Board-to-board electronic interface using hemi-ellipsoidal surface featuresAGILENT TECHNOLOGIES INC·Filed 2006·Granted Mar 4, 2008·1 cites·6 claims
- 1861US6638080B2Integrated ball grid array-pin grid array-flex laminate test assemblyAGILENT TECHNOLOGIES INC·Filed 2001·Granted Oct 28, 2003·8 cites·7 claims
- 1960US6169411B1Integrated circuit testing assembly and methodAGILENT TECHNOLOGIES INC·Filed 1997·Granted Jan 2, 2001·22 cites·3 claims
- 2058US5680057AIntegrated circuit testing assembly and methodHEWLETT PACKARD CO·Filed 1996·Granted Oct 21, 1997·16 cites·4 claims
- 2154US7492173B2Probe accessories, and methods for probing test points using sameAGILENT TECHNOLOGIES INC·Filed 2006·Granted Feb 17, 2009·2 cites·19 claims
- 2253US5766978AProcess for testing an integrated circuit package using an integrated circuit package retainerHEWLETT PACKARD CO·Filed 1996·Granted Jun 16, 1998·15 cites·3 claims
- 2350US7372284B2Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socketAGILENT TECHNOLOGIES INC·Filed 2006·Granted May 13, 2008·1 cites·16 claims
- 2450US3986693AAuxiliary shock absorber mounting bracketJOHNSON KENNETH WILLIAM·Filed 1975·Granted Oct 19, 1976·14 cites·1 claims
- 2549US7145352B2Apparatus, method, and kit for probing a pattern of points on a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2004·Granted Dec 5, 2006·4 cites·13 claims
- 2647US7531899B2Ball grid array packageAGILENT TECHNOLOGIES INC·Filed 2006·Granted May 12, 2009·0 cites·9 claims
- 2746US2008087279A1Metered dose inhalerTIECK CATHARINE LAUREEN JOHNSO·Filed 2006·Application pending·0 cites
- 2845US6030254AEdge connector interposing probeHEWLETT PACKARD CO·Filed 1998·Granted Feb 29, 2000·12 cites·30 claims
- 2943US2008151512A1Enhanced Ball Grid Array PackageJOHNSON KENNETH W·Filed 2006·Application pending·0 cites
- 3043US2006249303A1Connectorless electronic interface between rigid and compliant members using hemi-ellipsoidal surface featuresJOHNSON KENNETH W·Filed 2005·Application pending·0 cites
- 3140US6144213ABall grid array probing techniqueAGILENT TECHNOLOGIES INC·Filed 1998·Granted Nov 7, 2000·8 cites·12 claims
- 3239US2013106401A1Oscilloscope probe comprising status indicatorJOHNSON KENNETH W·Filed 2011·Application pending·0 cites
- 3336US2006022692A1Backside attach probe, components thereof, and methods for making and using sameLAMERES BROCK J·Filed 2004·Application pending·0 cites
- 3436US2006264096A1Surface mount retention moduleJOHNSON KENNETH W·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →