Inventor · disambiguated record
Kevin Kolvenbach
Also filed as: KOLVENBACH KEVIN · KOLVENBACH KEVIN W
8 granted patents·223 citations·filing 2000–2015
87Inventor score
Top patents by PatentIndex Score
8 records- 0196US8304863B2Electromigration immune through-substrate viasFILIPPI RONALD G·Filed 2010·Granted Nov 6, 2012·38 cites·8 claims
- 0294US6476632B1Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoringIBM·Filed 2000·Granted Nov 5, 2002·153 cites·13 claims
- 0386US7710141B2Method and apparatus for dynamic characterization of reliability wearout mechanismsIBM·Filed 2008·Granted May 4, 2010·14 cites·19 claims
- 0477US7375371B2Structure and method for thermally stressing or testing a semiconductor deviceIBM·Filed 2006·Granted May 20, 2008·9 cites·18 claims
- 0575US9153558B2Electromigration immune through-substrate viasFILIPPI RONALD G·Filed 2012·Granted Oct 6, 2015·3 cites·9 claims
- 0675US7805274B2Structure and methodology for characterizing device self-heatingIBM·Filed 2006·Granted Sep 28, 2010·4 cites·18 claims
- 0769US9453873B2Non-planar field effect transistor test structure and lateral dielectric breakdown testing methodIBM·Filed 2014·Granted Sep 27, 2016·2 cites·20 claims
- 0840US9851398B2Via leakage and breakdown testingGLOBALFOUNDRIES INC·Filed 2015·Granted Dec 26, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →