Inventor · disambiguated record
Kentaro Konishi
Also filed as: KONISHI KENTARO
12 granted patents·1 pending application·58 citations·filing 2001–2023
84Inventor score
Top patents by PatentIndex Score
13 records- 0181US11181573B2Inspection apparatus and cleaning method of inspection apparatusTOKYO ELECTRON LTD·Filed 2019·Granted Nov 23, 2021·2 cites·16 claims
- 0280US7148895B2Time-series data processing device and methodSCALE INC·Filed 2001·Granted Dec 12, 2006·54 cites·38 claims
- 0372US11099236B2Inspection device and contact methodTOKYO ELECTRON LTD·Filed 2018·Granted Aug 24, 2021·1 cites·18 claims
- 0463US11067624B2Inspection systemTOKYO ELECTRON LTD·Filed 2018·Granted Jul 20, 2021·1 cites·17 claims
- 0559US12061226B2Support device, test system, and method of controlling support deviceTOKYO ELECTRON LTD·Filed 2022·Granted Aug 13, 2024·0 cites·10 claims
- 0659US11852677B2Test systemTOKYO ELECTRON LTD·Filed 2020·Granted Dec 26, 2023·0 cites·6 claims
- 0754US11933839B2Inspection apparatus and inspection methodTOKYO ELECTRON LTD·Filed 2022·Granted Mar 19, 2024·0 cites·5 claims
- 0849US11467208B2Contact release method in inspection apparatus and inspection apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Oct 11, 2022·0 cites·11 claims
- 0949US2025208169A1Inspection method and inspection deviceTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1047US12117483B2Inspection system and inspection methodTOKYO ELECTRON LTD·Filed 2020·Granted Oct 15, 2024·0 cites·14 claims
- 1147US11442096B2Testing apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Sep 13, 2022·0 cites·10 claims
- 1246US11169206B2Inspection apparatus, inspection system, and aligning methodTOKYO ELECTRON LTD·Filed 2018·Granted Nov 9, 2021·0 cites·12 claims
- 1340US11454664B2Testing systemTOKYO ELECTRON LTD·Filed 2018·Granted Sep 27, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →