Inventor · disambiguated record
Ken Guillaume Lagarec
Also filed as: LAGAREC KEN · LAGAREC KEN G · LAGAREC KEN GUILLAUME
20 granted patents·3 pending applications·136 citations·filing 2005–2025
94Inventor score
Top patents by PatentIndex Score
23 records- 0198US10886100B2Method and system for cross-sectioning a sample with a preset thickness or to a target siteFIBICS INCORPORATED·Filed 2020·Granted Jan 5, 2021·7 cites·22 claims
- 0297US11462383B2Method and system for iteratively cross-sectioning a sample to correlatively targeted sitesFIBICS INCORPORATED·Filed 2020·Granted Oct 4, 2022·3 cites·27 claims
- 0396US8552406B2Apparatus and method for surface modification using charged particle beamsPHANEUF MICHAEL WILLIAM·Filed 2011·Granted Oct 8, 2013·52 cites·20 claims
- 0495US11923168B2Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beamsFIBICS INCORPORATED·Filed 2022·Granted Mar 5, 2024·1 cites·19 claims
- 0594US9812290B2Microscopy imaging method and systemFIBICS INCORPORATED·Filed 2017·Granted Nov 7, 2017·10 cites·19 claims
- 0694US9633819B2Microscopy imaging method and systemPHANEUF MICHAEL WILLIAM·Filed 2012·Granted Apr 25, 2017·21 cites·11 claims
- 0793US10586680B2Microscopy imaging method and systemFIBICS INCORPORATED·Filed 2017·Granted Mar 10, 2020·5 cites·15 claims
- 0889US12255044B2Fiducial guided cross-sectioning and lamella preparation with tomographic data collectionFIBICS INCORPORATED·Filed 2024·Granted Mar 18, 2025·0 cites·42 claims
- 0985US12007344B2Method for cross-section sample preparationFIBICS INCORPORATED·Filed 2023·Granted Jun 11, 2024·0 cites·14 claims
- 1082US9915628B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2016·Granted Mar 13, 2018·3 cites·19 claims
- 1182US8791436B1Circuit tracing using a focused ion beamPAWLOWICZ CHRIS·Filed 2013·Granted Jul 29, 2014·8 cites·15 claims
- 1281US11726050B2Method for cross-section sample preparationFIBICS INCORPORATED·Filed 2022·Granted Aug 15, 2023·0 cites·13 claims
- 1379USRE50001EMethod and system for cross-sectioning a sample with a preset thickness or to a target siteFIBICS INCORPORATED·Filed 2021·Granted Jun 4, 2024·0 cites·26 claims
- 1479US2025166961A1Microscopy imaging method and systemFIBICS INCORPORATED·Filed 2025·Application pending·0 cites
- 1578US8466415B2Methods for performing circuit edit operations with low landing energy electron beamsPHANEUF MICHAEL WILLIAM·Filed 2006·Granted Jun 18, 2013·5 cites·14 claims
- 1678US7535000B2Method and system for identifying events in FIBDCG SYSTEMS INC·Filed 2006·Granted May 19, 2009·4 cites·42 claims
- 1777US8093567B2Method and system for counting secondary particlesLAGAREC KEN GUILLAUME·Filed 2007·Granted Jan 10, 2012·6 cites·25 claims
- 1876US7897918B2System and method for focused ion beam data analysisDCG Systems·Filed 2005·Granted Mar 1, 2011·8 cites·42 claims
- 1969US11366074B2Method for cross-section sample preparationFIBICS INCORPORATED·Filed 2018·Granted Jun 21, 2022·0 cites·22 claims
- 2068US7893397B2Apparatus and method for surface modification using charged particle beamsFIBICS INC·Filed 2006·Granted Feb 22, 2011·3 cites·5 claims
- 2161US2025157781A1Method for operating a particle beam apparatus, computer program product and particle beam apparatus for carrying out the methodZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 2255US9383327B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2014·Granted Jul 5, 2016·0 cites·15 claims
- 2337US2013001191A1Redeposition technique for membrane attachmentFIBICS INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →