Inventor · disambiguated record
Kenneth A. Lavallee
Also filed as: LAVALLEE KENNETH A
2 granted patents·1 pending application·28 citations·filing 2001–2013
59Inventor score
Top patents by PatentIndex Score
3 records- 0175US6557132B2Method and system for determining common failure modes for integrated circuitsIBM·Filed 2001·Granted Apr 29, 2003·25 cites·13 claims
- 0268US9285417B2Low-voltage IC test for defect screeningGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 15, 2016·3 cites·20 claims
- 0329US2004066837A1Method and apparatus for providing accurate junction temperature in an integrated circuitFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →