Inventor · disambiguated record
Keumsil Lee
Also filed as: LEE KEUMSIL
4 granted patents·5 pending applications·0 citations·filing 2020–2025
54Inventor score
Files withZEISS CARL SMT GMBH9
Top patents by PatentIndex Score
9 records- 0168US2025239474A1Contact area size determination between 3d structures in an integrated semiconductor sampleZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0267US12283504B2Contact area size determination between 3D structures in an integrated semiconductor sampleZEISS CARL SMT GMBH·Filed 2022·Granted Apr 22, 2025·0 cites·20 claims
- 0365US11915908B2Method for measuring a sample and microscope implementing the methodZEISS CARL SMT GMBH·Filed 2021·Granted Feb 27, 2024·0 cites·21 claims
- 0462US2025362253A13d volume inspection method and method of configuring of a 3d volume inspection methodZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0560US2025272946A1Sensor fusion for thin film segmentationZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0656US11436506B2Method and devices for determining metrology sitesZEISS CARL SMT GMBH·Filed 2020·Granted Sep 6, 2022·0 cites·27 claims
- 0751US12288705B2FIB-SEM 3D tomography for measuring shape deviations of HAR structuresZEISS CARL SMT GMBH·Filed 2022·Granted Apr 29, 2025·0 cites·19 claims
- 0851US2024281952A13d volume inspection method and method of configuring of a 3d volume inspection methodZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 0946US2022138973A1Cross section imaging with improved 3d volume image reconstruction accuracyZEISS CARL SMT GMBH·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →