Inventor · disambiguated record
Kenichi Nishinaka
Also filed as: NISHINAKA KENICHI
7 granted patents·2 pending applications·16 citations·filing 2008–2021
75Inventor score
Technology areasH01J
Top patents by PatentIndex Score
9 records- 0182US8822945B2Focused ion beam apparatusNISHINAKA KENICHI·Filed 2011·Granted Sep 2, 2014·9 cites·7 claims
- 0281US7755065B2Focused ion beam apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Jul 13, 2010·7 cites·10 claims
- 0355US12463004B2Charged particle microscope and stageHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 4, 2025·0 cites·15 claims
- 0445US11183359B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 23, 2021·0 cites·10 claims
- 0545US11107656B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 31, 2021·0 cites·12 claims
- 0645US8389953B2Focused ion beam apparatusOGAWA TAKASHI·Filed 2011·Granted Mar 5, 2013·0 cites·16 claims
- 0745US2024404782A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0838US8513602B2Focused ion beam apparatusOGAWA TAKASHI·Filed 2010·Granted Aug 20, 2013·0 cites·14 claims
- 0938US2011215256A1Focused ion beam apparatusOGAWA TAKASHI·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kenichi Nishinaka files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →