Inventor · disambiguated record
Kenji Numata
Also filed as: NUMATA KENJI
36 granted patents·4 pending applications·498 citations·filing 1991–2023
98Inventor score
Top patents by PatentIndex Score
40 records- 0192US7058863B2Semiconductor integrated circuitTOSHIBA KK·Filed 2002·Granted Jun 6, 2006·85 cites·17 claims
- 0287US10799259B2Venous valve incising blades, manufacturing method of the same and artery revascularization treatment using the sameFURUYA TAKATOSHI·Filed 2018·Granted Oct 13, 2020·12 cites·11 claims
- 0387US9872693B2Venous valve incising blades, manufacturing method of the same and artery revascularization treatment using the sameFURUYA TAKATOSHI·Filed 2015·Granted Jan 23, 2018·14 cites·18 claims
- 0481US9964699B2System and method for using hollow core photonic crystal fibersNASA·Filed 2015·Granted May 8, 2018·3 cites·17 claims
- 0580US10816463B1Fast and widely tunable monolithic optical parametric oscillator for laser spectrometerNASA·Filed 2018·Granted Oct 27, 2020·2 cites·11 claims
- 0679US11394168B1Micro non-planar ring oscillator with optimized output power and minimized noise in a reduced size packageNASA·Filed 2019·Granted Jul 19, 2022·2 cites·14 claims
- 0778US5881006ASemiconductor memory deviceTOSHIBA KK·Filed 1997·Granted Mar 9, 1999·35 cites·23 claims
- 0876US10348052B1Tunable laser system and method based on dual sideband lockingNASA·Filed 2017·Granted Jul 9, 2019·2 cites·24 claims
- 0976US5734619ASemiconductor memory device having cell array divided into a plurality of cell blocksTOSHIBA KK·Filed 1992·Granted Mar 31, 1998·30 cites·17 claims
- 1075US10819080B1Coating-less nonplanar planar ring oscillator laserNASA·Filed 2019·Granted Oct 27, 2020·1 cites·20 claims
- 1175US6295241B1Dynamic random access memory deviceTOSHIBA KK·Filed 1994·Granted Sep 25, 2001·35 cites·15 claims
- 1273US5377152ASemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1992·Granted Dec 27, 1994·25 cites·29 claims
- 1369US5532963ASemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1995·Granted Jul 2, 1996·23 cites·5 claims
- 1468US5640351ASemiconductor memory circuit having data buses common to a plurality of memory cell arraysTOSHIBA KK·Filed 1996·Granted Jun 17, 1997·28 cites·16 claims
- 1563US9041825B2Image processing apparatusNUMATA KENJI·Filed 2012·Granted May 26, 2015·1 cites·4 claims
- 1663US5559748ASemiconductor integrated circuit allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1995·Granted Sep 24, 1996·15 cites·69 claims
- 1762US5608674ASemiconductor memory deviceTOSHIBA KK·Filed 1995·Granted Mar 4, 1997·22 cites·18 claims
- 1862US5555523ASemiconductor memory deviceTOSHIBA KK·Filed 1995·Granted Sep 10, 1996·22 cites·20 claims
- 1961US2023238764A1Piezo-tuned nonplanar ring oscillator with GHz range and 100 kHz bandwidthKANE THOMAS JAMES·Filed 2023·Application pending·0 cites
- 2059US6141288ASemiconductor memory device allowing change of refresh mode and address switching method therewithTOSHIBA KK·Filed 1999·Granted Oct 31, 2000·12 cites·14 claims
- 2159US5970006ASemiconductor memory device having cell array divided into a plurality of cell blocksTOSHIBA KK·Filed 1998·Granted Oct 19, 1999·14 cites·10 claims
- 2259US5594265AInput protection circuit formed in a semiconductor substrateTOSHIBA KK·Filed 1991·Granted Jan 14, 1997·17 cites·13 claims
- 2358US5754481AClock synchronous type DRAM with latchTOSHIBA KK·Filed 1997·Granted May 19, 1998·16 cites·8 claims
- 2457US7970025B2System and method for tuning adjusting the central frequency of a laser while maintaining frequency stabilization to an external referenceNASA·Filed 2009·Granted Jun 28, 2011·2 cites·20 claims
- 2556US5633827ASemiconductor integrated circuit device allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1995·Granted May 27, 1997·10 cites·14 claims
- 2655US8730313B2Endoscope apparatus and methodNUMATA KENJI·Filed 2010·Granted May 20, 2014·1 cites·13 claims
- 2753US5812481ASemiconductor integrated circuit device allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1996·Granted Sep 22, 1998·9 cites·57 claims
- 2852US9065242B2Apparatus and method to enable precision and fast laser frequency tuningCHEN JEFFREY R·Filed 2012·Granted Jun 23, 2015·1 cites·10 claims
- 2952US5706229ASemiconductor memory deviceTOSHIBA KK·Filed 1995·Granted Jan 6, 1998·12 cites·24 claims
- 3052US5659507AClock synchronous type DRAM with data latchTOSHIBA KK·Filed 1996·Granted Aug 19, 1997·12 cites·21 claims
- 3149US5949109ASemiconductor device having input protection circuitTOSHIBA KK·Filed 1997·Granted Sep 7, 1999·10 cites·22 claims
- 3248US5698876AMemory standard cell macro for semiconductor deviceTOSHIBA KK·Filed 1995·Granted Dec 16, 1997·11 cites·9 claims
- 3346US7331249B2Non-destructive inspection apparatus and non-destructive inspection systemOLYMPUS CORP·Filed 2005·Granted Feb 19, 2008·0 cites·6 claims
- 3445US10194084B2Image processing device and computer-readable storage device for selectively outputting reference image and synthesized imageOLYMPUS CORP·Filed 2017·Granted Jan 29, 2019·0 cites·12 claims
- 3545USRE37184ESemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1998·Granted May 22, 2001·7 cites·9 claims
- 3645US2018296065A1Endoscope deviceOLYMPUS CORP·Filed 2018·Application pending·0 cites
- 3744US5862090ASemiconductor memory device having cell array divided into a plurality of cell blocksTOSHIBA KK·Filed 1997·Granted Jan 19, 1999·7 cites·17 claims
- 3839US2012209064A1Endoscope apparatus and method of setting reference image of endoscope apparatusNUMATA KENJI·Filed 2012·Application pending·0 cites
- 3938US2001014966A1Program development method, program development apparatus, storage medium storing program development program and program development programNEC CORP·Filed 2001·Application pending·0 cites
- 4030US5970015ASemiconductor integrated circuit device allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1998·Granted Oct 19, 1999·0 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →