Inventor · disambiguated record
Kenichi Oi
Also filed as: OI KENICHI
11 granted patents·1 pending application·92 citations·filing 1995–2024
88Inventor score
Top patents by PatentIndex Score
12 records- 0180USD1016031SServo amplifierMITSUBISHI ELECTRIC CORP·Filed 2021·Granted Feb 27, 2024·8 cites·1 claims
- 0280USD1016033SServo amplifierMITSUBISHI ELECTRIC CORP·Filed 2021·Granted Feb 27, 2024·8 cites·1 claims
- 0379USD905638SServo amplifierMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Dec 22, 2020·18 cites·1 claims
- 0474USD918857SServo amplifierMITSUBISHI ELECTRIC CORP·Filed 2019·Granted May 11, 2021·12 cites·1 claims
- 0570US5574384ACombined board construction for burn-in and burn-in equipment for use with combined boardTABAI ESPEC CORP·Filed 1995·Granted Nov 12, 1996·38 cites·7 claims
- 0664USD1016032SServo amplifierMITSUBISHI ELECTRIC CORP·Filed 2021·Granted Feb 27, 2024·3 cites·1 claims
- 0758US7660411B2Portable telephoneMITSUBISHI ELECTRIC CORP·Filed 2004·Granted Feb 9, 2010·5 cites·2 claims
- 0835US7312522B2Mounting member of semiconductor device, mounting configuration of semiconductor device, and drive unit of semiconductor deviceESPEC CORP·Filed 2004·Granted Dec 25, 2007·0 cites·1 claims
- 0933USD1105695SMotor driver for a conveyor systemMITSUBISHI ELECTRIC CORP·Filed 2024·Granted Dec 9, 2025·0 cites·1 claims
- 1033USD1105696SMotor driver for a conveyor systemMITSUBISHI ELECTRIC CORP·Filed 2024·Granted Dec 9, 2025·0 cites·1 claims
- 1132US7214961B2Semiconductor testing device and semiconductor testing methodESPEC CORP·Filed 2004·Granted May 8, 2007·0 cites·8 claims
- 1230US2005116328A1Substrate and method of manufacture thereofFiled 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kenichi Oi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →