Inventor · disambiguated record
Kenji Shimazaki
Also filed as: SHIMAZAKI KENJI
23 granted patents·4 pending applications·394 citations·filing 1982–2012
96Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD13TOHO BESLON CO5PANASONIC CORP3ANDO TAKASHI1SHIMAZAKI KENJI1
Top patents by PatentIndex Score
27 records- 0189US4696742AActive carbon fibers and filter adsorption unit for water purification comprising said fibersTOHO BESLON CO·Filed 1986·Granted Sep 29, 1987·58 cites·7 claims
- 0286US6812171B2Carbon fiber sheet and process for production thereofTOHO TENAX CO LTD·Filed 2001·Granted Nov 2, 2004·21 cites·6 claims
- 0386US4576929AActive carbon fibers as adsorbent for water purificationTOHO BESLON CO·Filed 1984·Granted Mar 18, 1986·39 cites·11 claims
- 0485US4508851AFibrous activated carbon and process of producing itTOHO BESLON CO·Filed 1983·Granted Apr 2, 1985·26 cites·21 claims
- 0583US4861809AFriction materialTOHO RAYON KK·Filed 1988·Granted Aug 29, 1989·27 cites·20 claims
- 0683US4520623AActivated carbon fiber spun yarnTOHO BESLON CO·Filed 1983·Granted Jun 4, 1985·23 cites·14 claims
- 0783US4412937AMethod for manufacture of activated carbon fiberTOHO BESLON CO·Filed 1982·Granted Nov 1, 1983·26 cites·23 claims
- 0881US7480875B2Method of designing a semiconductor integrated circuitPANASONIC CORP·Filed 2005·Granted Jan 20, 2009·12 cites·6 claims
- 0979US7225418B2Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted May 29, 2007·25 cites·38 claims
- 1076US8525552B2Semiconductor integrated circuit device having a plurality of standard cells for leakage current suppressionANDO TAKASHI·Filed 2012·Granted Sep 3, 2013·4 cites·16 claims
- 1173US6782347B2Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Aug 24, 2004·20 cites·27 claims
- 1272US7039572B1Method of analyzing electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted May 2, 2006·27 cites·2 claims
- 1372US6810340B2Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Oct 26, 2004·19 cites·58 claims
- 1468US6876210B2Method and apparatus for analyzing electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Apr 5, 2005·14 cites·28 claims
- 1567US7120551B2Method for estimating EMI in a semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Oct 10, 2006·5 cites·13 claims
- 1666US7278124B2Design method for semiconductor integrated circuit suppressing power supply noiseMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Oct 2, 2007·13 cites·22 claims
- 1762US6754598B2Electromagnetic interference analysis method and apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jun 22, 2004·10 cites·50 claims
- 1861US6959250B1Method of analyzing electromagnetic interferenceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Oct 25, 2005·10 cites·11 claims
- 1956US7307333B2Semiconductor device method of generating semiconductor device pattern method of semiconductor device and pattern generator for semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Dec 11, 2007·6 cites·9 claims
- 2055US7911027B2Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device, and apparatus for generating pattern for semiconductor devicePANASONIC CORP·Filed 2007·Granted Mar 22, 2011·1 cites·6 claims
- 2144US2005005254A1Substrate noise analyzing method for semiconductor integrated circuit, semiconductor integrated circuit, and substrate noise analyzing device for semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 2243US2006091550A1Method of analyzing operation of semiconductor integrated circuit device, analyzing apparatus used in the same, and optimization designing method using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 2338US7779376B2Operation analysis method of semiconductor integrated circuitPANASONIC CORP·Filed 2007·Granted Aug 17, 2010·0 cites·30 claims
- 2435US6321168B1Means of calculating power consumption characteristic and method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Nov 20, 2001·8 cites·35 claims
- 2534US2005114054A1Method for analyzing power supply noise of semiconductor integrated circuitFiled 2004·Application pending·0 cites
- 2633US2002045995A1Electromagnetic interference analysis method and apparatusFiled 2001·Application pending·0 cites
- 2731US8407312B2Data delivery apparatusSHIMAZAKI KENJI·Filed 2011·Granted Mar 26, 2013·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →