Inventor · disambiguated record
Kenichi Shitara
Also filed as: SHITARA KENICHI
12 granted patents·2 pending applications·40 citations·filing 2000–2012
87Inventor score
Top patents by PatentIndex Score
14 records- 0179US6473258B1Magnetic disk read/write circuit having core coils of opposite phaseHITACHI ELECTR ENG·Filed 2000·Granted Oct 29, 2002·14 cites·11 claims
- 0277US7035039B2Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridgeHITACHI ELECTR ENG·Filed 2002·Granted Apr 25, 2006·12 cites·22 claims
- 0370US8294888B2Surface defect inspection method and apparatusSHITARA KENICHI·Filed 2010·Granted Oct 23, 2012·1 cites·7 claims
- 0470US8089714B2Deterioration detection method of composite magnetic head and magnetic disk inspection apparatusSHITARA KENICHI·Filed 2010·Granted Jan 3, 2012·3 cites·10 claims
- 0565US8031421B2Method for measuring optimum seeking time and inspection apparatus using the sameHITACHI HIGH TECH CORP·Filed 2010·Granted Oct 4, 2011·3 cites·10 claims
- 0660US8295000B2Method and its apparatus for inspecting a magnetic diskSHITARA KENICHI·Filed 2011·Granted Oct 23, 2012·1 cites·16 claims
- 0758US8502966B2Surface defect inspection method and apparatusSHITARA KENICHI·Filed 2012·Granted Aug 6, 2013·0 cites·5 claims
- 0858US8488116B2Surface defect inspection method and apparatusSHITARA KENICHI·Filed 2012·Granted Jul 16, 2013·0 cites·6 claims
- 0957US6552535B2Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuitHITACHI ELECTR ENG·Filed 2001·Granted Apr 22, 2003·6 cites·12 claims
- 1047US2007245814A1Magnetic disk defect test method, protrusion test device and glide testerSHITARA KENICHI·Filed 2007·Application pending·0 cites
- 1143US7929232B2Test method of a magnetic disk and magnectic disk testerHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 19, 2011·0 cites·16 claims
- 1238US2012026622A1Method and apparatus for inspecting magnetic diskSHITARA KENICHI·Filed 2011·Application pending·0 cites
- 1336US8457926B2Disk protrusion detection/flatness measurement circuit and disk glide testerSHITARA KENICHI·Filed 2010·Granted Jun 4, 2013·0 cites·4 claims
- 1434US8547547B2Optical surface defect inspection apparatus and optical surface defect inspection methodTAMURA SHINTARO·Filed 2011·Granted Oct 1, 2013·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →