Inventor · disambiguated record
Keith C. Stevens
Also filed as: STEVENS KEITH C
9 granted patents·136 citations·filing 1998–2015
88Inventor score
Top patents by PatentIndex Score
9 records- 0193US8471575B2Methodologies and test configurations for testing thermal interface materialsFREGEAU DUSTIN·Filed 2010·Granted Jun 25, 2013·22 cites·15 claims
- 0283US6191599B1IC device under test temperature control fixtureIBM·Filed 1998·Granted Feb 20, 2001·57 cites·9 claims
- 0377US6545333B1Light controlled silicon on insulator deviceIBM·Filed 2001·Granted Apr 8, 2003·23 cites·22 claims
- 0473US9116200B2Methodologies and test configurations for testing thermal interface materialsIBM·Filed 2013·Granted Aug 25, 2015·2 cites·19 claims
- 0568US9285417B2Low-voltage IC test for defect screeningGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 15, 2016·3 cites·20 claims
- 0662US9658255B2Signal monitoring of through-wafer vias using a multi-layer inductorIBM·Filed 2015·Granted May 23, 2017·1 cites·20 claims
- 0759US6458634B1Reduction of induced charge in SOI devices during focused ion beam processingIBM·Filed 2001·Granted Oct 1, 2002·9 cites·19 claims
- 0854US6529018B1Method for monitoring defects in polysilicon gates in semiconductor devices responsive to illumination by incident lightIBM·Filed 1998·Granted Mar 4, 2003·19 cites·5 claims
- 0952US9372208B2Signal monitoring of through-wafer vias using a multi-layer inductorIBM·Filed 2014·Granted Jun 21, 2016·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →