Inventor · disambiguated record
Kevin Van De Ruit
Also filed as: VAN DE RUIT KEVIN
2 granted patents·1 pending application·0 citations·filing 2016–2020
23Inventor score
Technology areasG03F
Files withASML NETHERLANDS BV3
Top patents by PatentIndex Score
3 records- 0159US11435673B2Method of determining a set of metrology points on a substrate, associated apparatus and computer programASML NETHERLANDS BV·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 0236US10459354B2Lithographic apparatus and lithographic projection methodASML NETHERLANDS BV·Filed 2016·Granted Oct 29, 2019·0 cites·20 claims
- 0333US2019384164A1Method of determining pellicle degradation compensation corrections, and associated lithographic apparatus and computer programASML NETHERLANDS BV·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →