Inventor · disambiguated record
Kenichi Washio
Also filed as: WASHIO KENICHI
6 granted patents·4 pending applications·22 citations·filing 2007–2013
78Inventor score
Top patents by PatentIndex Score
10 records- 0185US8525539B2Electrical connecting apparatus and testing system using the sameWASHIO KENICHI·Filed 2010·Granted Sep 3, 2013·8 cites·13 claims
- 0281US8253433B2Testing apparatus for integrated circuitWASHIO KENICHI·Filed 2010·Granted Aug 28, 2012·6 cites·14 claims
- 0363US8278965B2Inspection apparatusWASHIO KENICHI·Filed 2010·Granted Oct 2, 2012·3 cites·6 claims
- 0460US9910089B2Inspection unit, probe card, inspection device, and control system for inspection deviceNIHON MICRONICS KK·Filed 2013·Granted Mar 6, 2018·1 cites·17 claims
- 0554US8471586B2Wafer prober for semiconductor inspection and inspection methodWASHIO KENICHI·Filed 2010·Granted Jun 25, 2013·1 cites·10 claims
- 0654US7719300B2Method for testing a semiconductor wafer and apparatus thereofNIHON MICRONICS KK·Filed 2008·Granted May 18, 2010·3 cites·7 claims
- 0741US2007159194A1Probing apparatusHASEGAWA YOSHIEI·Filed 2007·Application pending·0 cites
- 0841US2007159192A1Probing apparatusHASEGAWA YOSHIEI·Filed 2007·Application pending·0 cites
- 0938US2008297184A1Semiconductor test apparatusNIHON MICRONICS KK·Filed 2008·Application pending·0 cites
- 1038US2013187676A1Inspection apparatusWASHIO KENICHI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →