Inventor · disambiguated record
Kenji Watanabe
Also filed as: HASHIMOTO AKIRA · KURASHINA HIROYASU · WATANABE KENJI
473 granted patents·65 pending applications·9,006 citations·filing 1976–2025
99Inventor score
Top patents by PatentIndex Score
538 records- 0199US7420164B2Objective lens, electron beam system and method of inspecting defectEBARA CORP·Filed 2005·Granted Sep 2, 2008·68 cites·1 claims
- 0299US7109483B2Method for inspecting substrate, substrate inspecting system and electron beam apparatusEBARA CORP·Filed 2001·Granted Sep 19, 2006·159 cites·9 claims
- 0398US9368314B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2014·Granted Jun 14, 2016·38 cites·10 claims
- 0498US8342519B2Sheet conveying device and image forming apparatusCANON KK·Filed 2010·Granted Jan 1, 2013·23 cites·10 claims
- 0598US7138629B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2004·Granted Nov 21, 2006·151 cites·22 claims
- 0698US6992290B2Electron beam inspection system and inspection method and method of manufacturing devices using the systemTOSHIBA KK·Filed 2001·Granted Jan 31, 2006·97 cites·5 claims
- 0798US6593152B2Electron beam apparatus and method of manufacturing semiconductor device using the apparatusEBARA CORP·Filed 2001·Granted Jul 15, 2003·109 cites·60 claims
- 0898US6149325ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1999·Granted Nov 21, 2000·107 cites·12 claims
- 0998US5492420ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1993·Granted Feb 20, 1996·119 cites·13 claims
- 1097US8497476B2Inspection deviceHATAKEYAMA MASAHIRO·Filed 2012·Granted Jul 30, 2013·42 cites·10 claims
- 1197US7741601B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2008·Granted Jun 22, 2010·36 cites·13 claims
- 1297US7365324B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2006·Granted Apr 29, 2008·49 cites·7 claims
- 1397US7351969B2Electron beam inspection system and inspection method and method of manufacturing devices using the systemEBARA CORP·Filed 2005·Granted Apr 1, 2008·37 cites·5 claims
- 1497US7223973B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerEBARA CORP·Filed 2005·Granted May 29, 2007·38 cites·10 claims
- 1597US7220604B2Method and apparatus for repairing shape, and method for manufacturing semiconductor device using thoseEBARA CORP·Filed 2005·Granted May 22, 2007·59 cites·11 claims
- 1697US6909092B2Electron beam apparatus and device manufacturing method using sameTOSHIBA KK·Filed 2003·Granted Jun 21, 2005·77 cites·17 claims
- 1797US6855929B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerEBARA CORP·Filed 2001·Granted Feb 15, 2005·106 cites·55 claims
- 1897US6012860ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1999·Granted Jan 11, 2000·90 cites·15 claims
- 1997US5997194ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1998·Granted Dec 7, 1999·87 cites·9 claims
- 2097US5887993ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1997·Granted Mar 30, 1999·84 cites·11 claims
- 2197US5765954ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1997·Granted Jun 16, 1998·86 cites·22 claims
- 2297US5605404ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1995·Granted Feb 25, 1997·98 cites·13 claims
- 2397US5595447ATape cartridge and printing device having print medium cartridgeSEIKO EPSON CORP·Filed 1993·Granted Jan 21, 1997·130 cites·26 claims
- 2497USD329862SCombined instant camera and printerKING JIM CO LTD·Filed 1990·Granted Sep 29, 1992·103 cites·1 claims
- 2596US9134695B2Image forming apparatus with movable cartridge pressing memberCANON KK·Filed 2013·Granted Sep 15, 2015·20 cites·17 claims
- 2696US8439358B2Sheet conveying apparatus and image forming apparatusWATANABE KENJI·Filed 2012·Granted May 14, 2013·18 cites·13 claims
- 2796US7569838B2Electron beam inspection system and inspection method and method of manufacturing devices using the systemEBARA CORP·Filed 2008·Granted Aug 4, 2009·23 cites·5 claims
- 2896US6106171ATape printing device and cartridge used thereinSEIKO EPSON CORP·Filed 1999·Granted Aug 22, 2000·73 cites·18 claims
- 2996US5967678ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1997·Granted Oct 19, 1999·73 cites·14 claims
- 3096US5961225ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1998·Granted Oct 5, 1999·75 cites·7 claims
- 3196US5788387ATape cartidge and printing deviceSEIKO EPSON CORP·Filed 1996·Granted Aug 4, 1998·118 cites·11 claims
- 3296US5752777ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1996·Granted May 19, 1998·76 cites·42 claims
- 3396US5634728ATape printing device and tape cartridge used therein having a cover with detection meansSEIKO EPSON CORP·Filed 1995·Granted Jun 3, 1997·80 cites·11 claims
- 3496US5599119ATape printing device and tape cartridge used thereinSEIKO EPSON CORP·Filed 1995·Granted Feb 4, 1997·88 cites·21 claims
- 3595US8822919B2Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using formerKIMBA TOSHIFUMI·Filed 2011·Granted Sep 2, 2014·15 cites·10 claims
- 3695US8740215B2Sheet conveying apparatus and image forming apparatusCANON KK·Filed 2013·Granted Jun 3, 2014·11 cites·6 claims
- 3795US8430393B2Sheet feeding apparatus and image forming apparatusMATSUSHIMA AKIRA·Filed 2010·Granted Apr 30, 2013·13 cites·16 claims
- 3895US7952510B2Solid-state imaging device, driving method thereof, and cameraPANASONIC CORP·Filed 2008·Granted May 31, 2011·29 cites·12 claims
- 3995US7671317B2Physical quantity detecting apparatus and method for driving the samePANASONIC CORP·Filed 2008·Granted Mar 2, 2010·31 cites·16 claims
- 4095US7411191B2Inspection system by charged particle beam and method of manufacturing devices using the systemEBARA CORP·Filed 2007·Granted Aug 12, 2008·20 cites·4 claims
- 4195US6797975B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2001·Granted Sep 28, 2004·56 cites·6 claims
- 4295US6386774B1Tape cartridge and printing deviceSEIKO EPSON CORP·Filed 2000·Granted May 14, 2002·57 cites·10 claims
- 4395US5835136AElectronic printer cameraKING JIM CO LTD·Filed 1991·Granted Nov 10, 1998·210 cites·2 claims
- 4495US5795086ATape printing deviceKING JIM CO LTD·Filed 1995·Granted Aug 18, 1998·87 cites·5 claims
- 4595US4969980AProcess for electroplating stainless steel strips with zinc or zinc-nickel alloyKAWASAKI STEEL CO·Filed 1988·Granted Nov 13, 1990·50 cites·4 claims
- 4695US4885215AZn-coated stainless steel welded pipeKAWASAKI STEEL CO·Filed 1987·Granted Dec 5, 1989·74 cites·7 claims
- 4795US4508064AInternal combustion engine of hydrogen gasBABA KATSUJI·Filed 1982·Granted Apr 2, 1985·83 cites·7 claims
- 4894US9035223B2Induction heat cooking deviceNOGUCHI SHINTARO·Filed 2009·Granted May 19, 2015·82 cites·15 claims
- 4994US8946631B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2014·Granted Feb 3, 2015·11 cites·14 claims
- 5094US8524804B2Surface-treated fiber, resin composition, and molded article of the compositionKITANO KATSUHISA·Filed 2009·Granted Sep 3, 2013·19 cites·7 claims
Showing the top 50 of 538 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Kenji Watanabe files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →