Inventor · disambiguated record
Kimihiko Arimoto
Also filed as: ARIMOTO KIMIHIKO
13 granted patents·3 pending applications·56 citations·filing 2005–2021
87Inventor score
Files withHORIBA LTD9ARIMOTO KIMIHIKO2HORIBA ADVANCED TECHNO CO LTD2HITACHI INT ELECTRIC INC1KISHIDA MAYUKO1
Top patents by PatentIndex Score
16 records- 0191US7327444B2Substrate inspection apparatus and methodHORIBA LTD·Filed 2005·Granted Feb 5, 2008·34 cites·22 claims
- 0280US8550710B2Sample cell for fluorescent X-ray analysis and sample cell assembly instrumentKISHIDA MAYUKO·Filed 2010·Granted Oct 8, 2013·9 cites·4 claims
- 0379US9007591B2Optical analyzerHORIBA LTD·Filed 2013·Granted Apr 14, 2015·5 cites·3 claims
- 0477US11280741B2Biological sample analysis deviceHORIBA ADVANCED TECHNO CO LTD·Filed 2018·Granted Mar 22, 2022·1 cites·8 claims
- 0575US8699031B2Optical measurement deviceARIMOTO KIMIHIKO·Filed 2011·Granted Apr 15, 2014·4 cites·7 claims
- 0666US8390812B2Optical measurement cellYOKOYAMA ISSEI·Filed 2011·Granted Mar 5, 2013·2 cites·4 claims
- 0754US12265028B2Optical measurement device and water quality analysis systemHORIBA ADVANCED TECHNO CO LTD·Filed 2021·Granted Apr 1, 2025·0 cites·9 claims
- 0852US8305574B2AnalyzerARIMOTO KIMIHIKO·Filed 2010·Granted Nov 6, 2012·1 cites·3 claims
- 0947US2009050779A1Vibration isolation systemHORIBA LTD·Filed 2008·Application pending·0 cites
- 1046US11949210B2Semiconductor laser device and analysis apparatusHORIBA LTD·Filed 2020·Granted Apr 2, 2024·0 cites·5 claims
- 1142US9176046B2Analyzing deviceHORIBA LTD·Filed 2014·Granted Nov 3, 2015·0 cites·4 claims
- 1241US10914707B2Reference electrodeHORIBA LTD·Filed 2015·Granted Feb 9, 2021·0 cites·9 claims
- 1338US2013273670A1Concentration Measuring Device used in Manufacturing ProcessHORIBA LTD·Filed 2013·Application pending·0 cites
- 1437US9897485B2Absorption spectrometerHORIBA LTD·Filed 2016·Granted Feb 20, 2018·0 cites·6 claims
- 1537US2018003626A1Gas concentration measurement apparatusHORIBA LTD·Filed 2017·Application pending·0 cites
- 1629USD813065SGas sampling cellHITACHI INT ELECTRIC INC·Filed 2016·Granted Mar 20, 2018·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →