Inventor · disambiguated record
Kim Gerard Feijen
Also filed as: FEIJEN KIM GERARD
2 granted patents·3 citations·filing 2016–2017
42Inventor score
Files withASML NETHERLANDS BV2
Top patents by PatentIndex Score
2 records- 0176US10416567B2Illumination system and metrology systemASML NETHERLANDS BV·Filed 2017·Granted Sep 17, 2019·2 cites·13 claims
- 0261US10101677B2Inspection apparatus for measuring properties of a target structure, methods of operating an optical system, method of manufacturing devicesASML NETHERLANDS BV·Filed 2016·Granted Oct 16, 2018·1 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →