Inventor · disambiguated record
Kiyoto Nakamura
Also filed as: NAKAMURA KIYOTO
14 granted patents·9 pending applications·44 citations·filing 1996–2023
87Inventor score
Top patents by PatentIndex Score
23 records- 0195US8988095B2Socket and electronic device test apparatusADVANTEST CORP·Filed 2012·Granted Mar 24, 2015·18 cites·5 claims
- 0265US11865463B2Computer, control method, non-transitory computer-readable medium, and terminal device that execute progress of a gameGREE INC·Filed 2022·Granted Jan 9, 2024·0 cites·20 claims
- 0363US7800386B2Contact device and method for producing the sameADVANTEST CORP·Filed 2008·Granted Sep 21, 2010·4 cites·15 claims
- 0462US2023257693A1BiosensorADVANTEST CORP·Filed 2023·Application pending·0 cites
- 0560US11318392B2Computer, control method, non-transitory computer-readable medium, and terminal device that execute progress of a gameGREE INC·Filed 2020·Granted May 3, 2022·0 cites·17 claims
- 0660US5793109AStructure of ohmic electrode for semiconductor by atomic layer dopingADVANTEST CORP·Filed 1996·Granted Aug 11, 1998·21 cites·3 claims
- 0759US9030223B2Test carrierNAKAMURA KIYOTO·Filed 2010·Granted May 12, 2015·1 cites·8 claims
- 0854US10835830B2Computer, control method, non-transitory computer-readable medium, and terminal device that execute progress of a gameGREE INC·Filed 2018·Granted Nov 17, 2020·0 cites·9 claims
- 0954US9250263B2Socket and electronic device test apparatusADVANTEST CORP·Filed 2015·Granted Feb 2, 2016·0 cites·4 claims
- 1051US9702901B2Test carrierADVANTEST CORP·Filed 2013·Granted Jul 11, 2017·0 cites·8 claims
- 1150US2022333150A1Biosensor, channel member used in biosensor, and method of using biosensorADVANTEST CORP·Filed 2020·Application pending·0 cites
- 1249US9645173B2Test carrierADVANTEST CORP·Filed 2013·Granted May 9, 2017·0 cites·3 claims
- 1347US8994394B2Test carrierKOGURE YOSHINARI·Filed 2012·Granted Mar 31, 2015·0 cites·5 claims
- 1442US8970243B2Test carrier and board assemblyKOGURE YOSHINARI·Filed 2012·Granted Mar 3, 2015·0 cites·7 claims
- 1542US2015168448A1Test carrierADVANTEST CORP·Filed 2013·Application pending·0 cites
- 1641US8952383B2Test carrierNAKAMURA KIYOTO·Filed 2012·Granted Feb 10, 2015·0 cites·6 claims
- 1741US2015061717A1Test carrier, defect determination apparatus, and defect determination methodADVANTEST CORP·Filed 2013·Application pending·0 cites
- 1840US8850907B2Test carrierNAKAMURA KIYOTO·Filed 2011·Granted Oct 7, 2014·0 cites·6 claims
- 1939US2008061922A1High frequency circuit apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 2039US2013120013A1Test carrier and method of assembly of test carrierFUJISAKI TAKASHI·Filed 2012·Application pending·0 cites
- 2138US2009195328A1Delay line, signal delay method, and test signal generating apparatusADVANTEST CORP·Filed 2008·Application pending·0 cites
- 2238US2013120015A1Test carrierNAKAMURA KIYOTO·Filed 2012·Application pending·0 cites
- 2338US2013120014A1Test carrierNAKAMURA KIYOTO·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →