Inventor · disambiguated record
Kiyoshi Takekoshi
Also filed as: TAKEKOSHI KIYOSHI
26 granted patents·3 pending applications·671 citations·filing 1988–2007
97Inventor score
Top patents by PatentIndex Score
29 records- 0197US6501289B1Inspection stage including a plurality of Z shafts, and inspection apparatusTOKYO ELECTRON LTD·Filed 2000·Granted Dec 31, 2002·119 cites·11 claims
- 0294US6359455B1Probing cardTOKYO ELECTRON LTD·Filed 2000·Granted Mar 19, 2002·64 cites·22 claims
- 0393US6672876B1Probe card with pyramid shaped thin film contactsTOKYO ELECTRON LTD·Filed 2000·Granted Jan 6, 2004·74 cites·5 claims
- 0492US4896869AMoving table apparatusTOKYO ELECTRON LTD·Filed 1988·Granted Jan 30, 1990·109 cites·18 claims
- 0586US7091733B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodIBIDEN CO LTD·Filed 2004·Granted Aug 15, 2006·30 cites·20 claims
- 0682US7242206B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodIBIDEN CO LTD·Filed 2005·Granted Jul 10, 2007·7 cites·43 claims
- 0782US6590381B1Contactor holding mechanism and automatic change mechanism for contactorTOKYO ELECTRON LTD·Filed 2000·Granted Jul 8, 2003·27 cites·20 claims
- 0879US6777967B2Inspection method and inspection apparatusTOKYO ELECTRON LTD·Filed 2001·Granted Aug 17, 2004·17 cites·3 claims
- 0979US5691764AApparatus for examining target objects such as LCD panelsTOKYO ELECTRON LTD·Filed 1995·Granted Nov 25, 1997·63 cites·19 claims
- 1078US7621045B2Method of producing a probe with a trapezoidal contactorTOKYO ELECTRON LTD·Filed 2007·Granted Nov 24, 2009·5 cites·1 claims
- 1177US5801545ALCD testing apparatusTOKYO ELECTRON LTD·Filed 1996·Granted Sep 1, 1998·63 cites·13 claims
- 1274US7602203B2Probe and probe cardTOKYO ELECTRON LTD·Filed 2006·Granted Oct 13, 2009·7 cites·11 claims
- 1371US6583614B2Inspection stage and inspection apparatus having a plurality of Z axesTOKYO ELECTRON LTD·Filed 2001·Granted Jun 24, 2003·15 cites·8 claims
- 1469US8101436B2Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive filmTAKEKOSHI KIYOSHI·Filed 2003·Granted Jan 24, 2012·13 cites·8 claims
- 1568US7256592B2Probe with trapezoidal contractor and device based on application thereof, and method of producing themTOKYO ELECTRON LTD·Filed 2002·Granted Aug 14, 2007·10 cites·3 claims
- 1667US8456186B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodTAKEKOSHI KIYOSHI·Filed 2007·Granted Jun 4, 2013·2 cites·23 claims
- 1766US7716824B2Method of manufacturing a probe cardTOKYO ELECTRON LTD·Filed 2006·Granted May 18, 2010·2 cites·14 claims
- 1864US8120372B2Probe card for inspecting light receiving deviceTAKEKOSHI KIYOSHI·Filed 2007·Granted Feb 21, 2012·2 cites·4 claims
- 1960US7221176B2Vacuum prober and vacuum probe methodTOKYO ELECTRON LTD·Filed 2005·Granted May 22, 2007·4 cites·12 claims
- 2055US6707310B2Needle load measuring method, needle load setting method and needle load detecting mechanismTOKYO ELECTRON LTD·Filed 2003·Granted Mar 16, 2004·10 cites·10 claims
- 2154US7061259B2Inspection method and inspection apparatusTOKYO ELECTRON LTD·Filed 2004·Granted Jun 13, 2006·4 cites·4 claims
- 2253US6024629AProbe apparatus and a method for polishing a probeTOKYO ELECTRON LTD·Filed 1998·Granted Feb 15, 2000·16 cites·12 claims
- 2350US6774621B2Inspection stage having a plurality of Z axesTOKYO ELECTRON LTD·Filed 2003·Granted Aug 10, 2004·4 cites·7 claims
- 2450US2009205372A1Method and device for forming hole in glass substrateTOYKO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 2546US7319339B2Inspection apparatus to break the oxide of an electrode by fritting phenomenonTOKYO ELECTRON LTD·Filed 2007·Granted Jan 15, 2008·0 cites·11 claims
- 2644US7304489B2Inspection method and inspection apparatusTOKYO ELECTRON LTD·Filed 2006·Granted Dec 4, 2007·0 cites·6 claims
- 2737US2001013787A1Needle load measuring method, needle load setting method and needle load detecting mechanismFiled 2001·Application pending·0 cites
- 2835US2001009376A1Probe arrangement assembly, method of manufacturing probe arrangement assembly, probe mounting method using probe arrangement assembly, and probe mounting apparatusFiled 2001·Application pending·0 cites
- 2932US4941800ATransfer apparatus for plate-like memberTOKYO ELECTRON LTD·Filed 1988·Granted Jul 17, 1990·4 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Kiyoshi Takekoshi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →