Inventor · disambiguated record
Konstantinos Adam
Also filed as: ADAM KONSTANTINOS · ADAM KONSTANTINOS G
11 granted patents·4 pending applications·64 citations·filing 2004–2017
88Inventor score
Top patents by PatentIndex Score
15 records- 0190US7836423B2Sum of coherent systems (SOCS) approximation based on object informationMENTOR GRAPHICS CORP·Filed 2007·Granted Nov 16, 2010·13 cites·23 claims
- 0290US7539954B2OPC simulation model using SOCS decomposition of edge fragmentsADAM KONSTANTINOS·Filed 2005·Granted May 26, 2009·18 cites·12 claims
- 0387US8799832B1Optical proximity correction for topographically non-uniform substratesMENTOR GRAPHICS CORP·Filed 2013·Granted Aug 5, 2014·5 cites·20 claims
- 0484US9857693B1Lithography model calibration via cache-based niching genetic algorithmsMENTOR GRAPHICS CORP·Filed 2017·Granted Jan 2, 2018·4 cites·27 claims
- 0581US10496780B1Dynamic model generation for lithographic simulationMENTOR GRAPHICS CORP·Filed 2017·Granted Dec 3, 2019·3 cites·21 claims
- 0677US8539393B2Simulation and correction of mask shadowing effectWORD JAMES C·Filed 2011·Granted Sep 17, 2013·5 cites·20 claims
- 0774US7536660B2OPC simulation model using SOCS decomposition of edge fragmentsADAM KONSTANTINOS·Filed 2004·Granted May 19, 2009·13 cites·11 claims
- 0869US9678435B1Horizontal development bias in negative tone development of photoresistMENTOR GRAPHICS CORP·Filed 2014·Granted Jun 13, 2017·1 cites·9 claims
- 0967US8645880B2Sum of coherent systems (SOCS) approximation based on object informationADAM KONSTANTINOS·Filed 2010·Granted Feb 4, 2014·1 cites·20 claims
- 1063USRE44792ERapid scattering simulation of objects in imaging using edge domain decompositionADAM KONSTANTINOS·Filed 2009·Granted Mar 4, 2014·1 cites·107 claims
- 1153US2009217218A1Opc simulation model using socs decomposition of edge fragmentsADAM KONSTANTINOS·Filed 2009·Application pending·0 cites
- 1245US10445452B2Simulation-assisted wafer rework determinationMENTOR GRAPHICS CORP·Filed 2017·Granted Oct 15, 2019·0 cites·17 claims
- 1343US2007253637A1Image intensity calculation using a sectored source mapMENTOR GRAPHICS CORP·Filed 2007·Application pending·0 cites
- 1437US2016140278A1Modeling Photoresist Shrinkage Effects In LithographyMENTOR GRAPHICS CORP·Filed 2016·Application pending·0 cites
- 1536US2018196349A1Lithography Model Calibration Via Genetic Algorithms with Adaptive Deterministic Crowding and Dynamic NichingMENTOR GRAPHICS CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →