Inventor · disambiguated record
Kouji Fujiyoshi
Also filed as: FUJIYOSHI KOUJI
3 granted patents·5 citations·filing 2003–2009
56Inventor score
Top patents by PatentIndex Score
3 records- 0156US7041512B2Electron beam exposure apparatus, electron beam exposing method, semiconductor element manufacturing method, and pattern error detection methodADVANTEST CORP·Filed 2003·Granted May 9, 2006·4 cites·24 claims
- 0247US8363099B2Microscope system and method of operation thereofOLYMPUS CORP·Filed 2009·Granted Jan 29, 2013·1 cites·7 claims
- 0330US8212865B2Microscope image pickup apparatus, microscope image pickup program product, microscope image pickup program transmission medium and microscope image pickup methodFUJIYOSHI KOUJI·Filed 2007·Granted Jul 3, 2012·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →