Inventor · disambiguated record
Kotaro Hasegawa
Also filed as: HASEGAWA KOTARO
6 granted patents·3 pending applications·5 citations·filing 2020–2024
70Inventor score
Top patents by PatentIndex Score
9 records- 0196US11821913B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 21, 2023·4 cites·20 claims
- 0280US12203958B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·17 claims
- 0376US11293966B2Test apparatus for determining pass or fail of LEDs, test method and computer-readable mediumADVANTEST CORP·Filed 2020·Granted Apr 5, 2022·1 cites·14 claims
- 0473US2025012847A1Test apparatus, test method, and computer-readable storage mediumADVANTEST CORP·Filed 2024·Application pending·0 cites
- 0564US12130324B2Test apparatus, test method, and computer-readable storage mediumADVANTEST CORP·Filed 2022·Granted Oct 29, 2024·0 cites·15 claims
- 0659US11800619B2Test apparatus, test method, and computer-readable storage mediumADVANTEST CORP·Filed 2022·Granted Oct 24, 2023·0 cites·14 claims
- 0757US2025067800A1Testing apparatus, testing method, and computer-readable storage mediumADVANTEST CORP·Filed 2024·Application pending·0 cites
- 0856US2024110969A1Testing apparatus, testing method, and computer-readable storage mediumADVANTEST CORP·Filed 2023·Application pending·0 cites
- 0955US11788885B2Test apparatus, test method, and computer-readable storage mediumADVANTEST CORP·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →