Inventor · disambiguated record
Kouji Iwasaki
Also filed as: IWASAKI KOUJI
21 granted patents·5 pending applications·220 citations·filing 1994–2010
95Inventor score
Top patents by PatentIndex Score
26 records- 0192US7442942B2Charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·20 cites·5 claims
- 0291US6395347B1Micromachining method for workpiece observationSEIKO INSTR INC·Filed 1994·Granted May 28, 2002·68 cites·14 claims
- 0385US6838685B1Ion beam apparatus, ion beam processing method and sample holder memberSII NANOTECHNOLOGY INC·Filed 2003·Granted Jan 4, 2005·26 cites·17 claims
- 0483US7973280B2Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the sameSII NANOTECHNOLOGY INC·Filed 2009·Granted Jul 5, 2011·7 cites·9 claims
- 0582US6593583B2Ion beam processing position correction methodSEIKO INSTR INC·Filed 2001·Granted Jul 15, 2003·28 cites·9 claims
- 0681US7626165B2Focused ion beam apparatus and method of preparing/observing sampleSII NANOTECHNOLOGY INC·Filed 2007·Granted Dec 1, 2009·7 cites·14 claims
- 0775US7267731B2Method and system for fabricating three-dimensional microstructureSII NANOTECHNOLOGY INC·Filed 2003·Granted Sep 11, 2007·11 cites·18 claims
- 0873US7067823B2Micro-sample pick-up apparatus and micro-sample pick-up methodSII NANOTECHNOLOGY INC·Filed 2004·Granted Jun 27, 2006·10 cites·19 claims
- 0972US7404339B2Probe and small sample pick up mechanismSII NANOTECHNOLOGY INC·Filed 2005·Granted Jul 29, 2008·3 cites·28 claims
- 1071US8269194B2Composite focused ion beam device, and processing observation method and processing method using the sameKAITO TAKASHI·Filed 2008·Granted Sep 18, 2012·3 cites·19 claims
- 1171US8191168B2Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscopeMAN XIN·Filed 2008·Granted May 29, 2012·3 cites·5 claims
- 1270US7345289B2Sample support prepared by semiconductor silicon process techniqueSII NANOTECHNOLOGY INC·Filed 2006·Granted Mar 18, 2008·4 cites·7 claims
- 1368US7297944B2Ion beam device and ion beam processing method, and holder memberSII NANOTECHNOLOGY INC·Filed 2003·Granted Nov 20, 2007·9 cites·15 claims
- 1467US7002150B2Thin specimen producing method and apparatusSII NANOTECHNOLOGY INC·Filed 2004·Granted Feb 21, 2006·6 cites·7 claims
- 1566US7276691B2Ion beam device and ion beam processing methodSII NANOTECHNOLOGY INC·Filed 2003·Granted Oct 2, 2007·6 cites·19 claims
- 1661US8304721B2Micro cross-section processing methodIWASAKI KOUJI·Filed 2010·Granted Nov 6, 2012·1 cites·4 claims
- 1751US8657962B2Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatusHAYASHI HIROKI·Filed 2008·Granted Feb 25, 2014·1 cites·11 claims
- 1850USD545693SClockIDEA INTERNAT CO LTD·Filed 2004·Granted Jul 3, 2007·7 cites·1 claims
- 1948US7736893B2Nanobio device of imitative anatomy structureSII NANOTECHNOLOGY INC·Filed 2006·Granted Jun 15, 2010·0 cites·13 claims
- 2045US2008265158A1Charged particle beam apparatusIWASAKI KOUJI·Filed 2008·Application pending·0 cites
- 2144US2004209163A1Electrochemical cellFiled 2004·Application pending·0 cites
- 2242US2005211922A1Minute three dimensional structure producing apparatus and methodMUNEKANE MASANAO·Filed 2005·Application pending·0 cites
- 2339US2004154744A1Method and system for surface or cross-sectional processing and observationFiled 2004·Application pending·0 cites
- 2439US2005035306A1Focused charged particle beam apparatusFiled 2003·Application pending·0 cites
- 2538US7060397B2EPL mask processing method and device thereofSII NANOTECHNOLOGY INC·Filed 2003·Granted Jun 13, 2006·0 cites·10 claims
- 2636US8581206B2Focused ion beam system and sample processing method using the sameMAN XIN·Filed 2010·Granted Nov 12, 2013·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →