Inventor · disambiguated record
Koichi Kawai
Also filed as: KAWAI KOICHI
76 granted patents·11 pending applications·865 citations·filing 1984–2025
99Inventor score
Top patents by PatentIndex Score
87 records- 0197US6907497B2Non-volatile semiconductor memory deviceTOSHIBA KK·Filed 2002·Granted Jun 14, 2005·204 cites·22 claims
- 0296US11393845B2Microelectronic devices, and related memory devices and electronic systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 19, 2022·4 cites·27 claims
- 0396US7145806B2Semiconductor memory device and method of controlling write sequence thereofTOSHIBA KK·Filed 2005·Granted Dec 5, 2006·55 cites·19 claims
- 0496US7110294B2Semiconductor memory deviceTOSHIBA KK·Filed 2005·Granted Sep 19, 2006·44 cites·14 claims
- 0594US7411830B2Nonvolatile memory cell having current compensated for temperature dependency and data read method thereofTOSHIBA KK·Filed 2006·Granted Aug 12, 2008·36 cites·22 claims
- 0694US7117296B2Method of programming non-volatile semiconductor memory device having an electrically erasable and programmable memory cell arrayTOSHIBA KK·Filed 2005·Granted Oct 3, 2006·37 cites·22 claims
- 0793US11922993B2Read-time overhead and power optimizations with command queues in memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Mar 5, 2024·2 cites·20 claims
- 0893US9305654B2Erase and soft program for vertical NAND flashINTEL CORP·Filed 2012·Granted Apr 5, 2016·13 cites·22 claims
- 0993US8477541B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsNAKAMURA HIROSHI·Filed 2012·Granted Jul 2, 2013·9 cites·32 claims
- 1092US7170780B2Semiconductor memory device and electric device with the sameTOSHIBA KK·Filed 2005·Granted Jan 30, 2007·32 cites·16 claims
- 1191US8218373B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsNAKAMURA HIROSHI·Filed 2010·Granted Jul 10, 2012·8 cites·19 claims
- 1291US7180778B2Semiconductor storage device having page copying functionTOSHIBA KK·Filed 2005·Granted Feb 20, 2007·16 cites·6 claims
- 1391US6661706B2Semiconductor storage device having page copyingTOSHIBA KK·Filed 2002·Granted Dec 9, 2003·36 cites·17 claims
- 1490US9318199B2Partial page memory operationsMICRON TECHNOLOGY INC·Filed 2012·Granted Apr 19, 2016·13 cites·34 claims
- 1588US9653171B2Partial page memory operationsMICRON TECHNOLOGY INC·Filed 2016·Granted May 16, 2017·8 cites·20 claims
- 1687US7286400B2Non-volatile semiconductor memory device with pass/fail detection circuitTOSHIBA KK·Filed 2005·Granted Oct 23, 2007·21 cites·9 claims
- 1786US7916555B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2008·Granted Mar 29, 2011·7 cites·24 claims
- 1885US8514624B2In-field block retiringPARAT KRISHNA K·Filed 2011·Granted Aug 20, 2013·13 cites·29 claims
- 1985US7023741B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2002·Granted Apr 4, 2006·18 cites·19 claims
- 2085US6751122B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2003·Granted Jun 15, 2004·30 cites·19 claims
- 2184US7453739B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2007·Granted Nov 18, 2008·7 cites·26 claims
- 2284US7376010B2Nonvolatile semiconductor memory device having protection function for each memory blockTOSHIBA KK·Filed 2006·Granted May 20, 2008·11 cites·7 claims
- 2380US9870831B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA MEMORY CORP·Filed 2016·Granted Jan 16, 2018·1 cites·19 claims
- 2480US7286420B2Semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Oct 23, 2007·9 cites·10 claims
- 2580US7254060B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Aug 7, 2007·9 cites·20 claims
- 2680US6898119B2Nonvolatile semiconductor memory and its test methodTOSHIBA KK·Filed 2004·Granted May 24, 2005·23 cites·12 claims
- 2779US7315473B2Semiconductor storage device having page copying functionTOSHIBA KK·Filed 2006·Granted Jan 1, 2008·7 cites·11 claims
- 2877US8537623B2Devices and methods of programming memory cellsKAWAI KOICHI·Filed 2011·Granted Sep 17, 2013·6 cites·20 claims
- 2977US2025266096A1Memory for programming data states of memory cellsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3076US2025029957A1Semiconductor devices including stacked dies with interleaved wire bonds and associated systems and methodsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3175US10699790B2Erase and soft program for vertical NAND flashINTEL CORP·Filed 2019·Granted Jun 30, 2020·2 cites·17 claims
- 3275US7224621B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2006·Granted May 29, 2007·4 cites·20 claims
- 3374US6807102B2Nonvolatile semiconductor memory and its test methodTOSHIBA KK·Filed 2003·Granted Oct 19, 2004·18 cites·18 claims
- 3473US9823880B1Method and apparatus for initiating pre-read operation before completion of data load operationINTEL CORP·Filed 2016·Granted Nov 21, 2017·3 cites·20 claims
- 3573US7251190B2Non-volatile semiconductor memory deviceTOSHIBA KK·Filed 2005·Granted Jul 31, 2007·6 cites·14 claims
- 3672US11295823B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsKIOXIA CORP·Filed 2020·Granted Apr 5, 2022·0 cites·20 claims
- 3772US8111551B2Nonvolatile semiconductor memory device having protection function for each memory blockTANAKA TOMOHARU·Filed 2011·Granted Feb 7, 2012·3 cites·11 claims
- 3872US7164605B2Semiconductor memory device and electric device with the sameTOSHIBA KK·Filed 2005·Granted Jan 16, 2007·4 cites·16 claims
- 3972US7061799B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2004·Granted Jun 13, 2006·14 cites·26 claims
- 4071US12136607B2Semiconductor devices including stacked dies with interleaved wire bonds and associated systems and methodsMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 5, 2024·0 cites·17 claims
- 4171US7303633B2Apparatus for producing optical information recording mediumFUJIFILM CORP·Filed 2005·Granted Dec 4, 2007·5 cites·9 claims
- 4271US6741499B2Non-volatile semiconductor memory deviceTOSHIBA KK·Filed 2002·Granted May 25, 2004·14 cites·20 claims
- 4371US2025046381A1Memory devices using a dynamic latch to provide multiple bias voltagesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4470US7123515B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsTOSHIBA KK·Filed 2005·Granted Oct 17, 2006·3 cites·15 claims
- 4570US6977845B2Semiconductor memory device and electric device with the sameTOSHIBA KK·Filed 2004·Granted Dec 20, 2005·13 cites·20 claims
- 4670US6717858B2Non-volatile semiconductor memory device in which one page is set for a plurality of memory cell arraysTOSHIBA KK·Filed 2002·Granted Apr 6, 2004·13 cites·31 claims
- 4769US7327616B2Non-volatile semiconductor memory deviceTOSHIBA KK·Filed 2005·Granted Feb 5, 2008·6 cites·18 claims
- 4868US12293790B2Memory for programming data states of memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted May 6, 2025·0 cites·21 claims
- 4967US8218374B2Semiconductor integrated circuit adapted to output pass/fail results of internal operationsNAKAMURA HIROSHI·Filed 2010·Granted Jul 10, 2012·1 cites·16 claims
- 5066US11778827B2Memory devices including multiplexer devices, and related electronic systemsMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 3, 2023·0 cites·20 claims
Showing the top 50 of 87 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →