Inventor · disambiguated record
Kodo Kawase
Also filed as: KAWASE KODO
11 granted patents·2 pending applications·78 citations·filing 2003–2017
89Inventor score
Top patents by PatentIndex Score
13 records- 0187US9897893B2Terahertz wave generation apparatusSHIBUYA CORP·Filed 2017·Granted Feb 20, 2018·4 cites·7 claims
- 0283US8119988B2Collection-amount detection method for particulate matters and collection-amount detection apparatus therefor and exhaust-gas converting apparatusDAIDO SHIGEKI·Filed 2008·Granted Feb 21, 2012·19 cites·10 claims
- 0382US8493057B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumNISHINA SHIGEKI·Filed 2010·Granted Jul 23, 2013·5 cites·10 claims
- 0479US6903341B2Apparatus for generating tera-Hertz wave and tuning methodRIKEN·Filed 2003·Granted Jun 7, 2005·21 cites·7 claims
- 0566US7173447B2Method and apparatus for diagnosing fault in semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Feb 6, 2007·6 cites·15 claims
- 0663US7291838B2Apparatus and method for detecting scattered material by terahertz waveRIKEN·Filed 2005·Granted Nov 6, 2007·1 cites·8 claims
- 0762US7381955B2Method and apparatus for inspecting target by tera-hertz wave spectrometryRIKEN·Filed 2004·Granted Jun 3, 2008·5 cites·23 claims
- 0861US8121157B2Terahertz beam scanning apparatus and method thereofMAKI KEN-ICHIRO·Filed 2009·Granted Feb 21, 2012·3 cites·6 claims
- 0958US7352449B2Method and apparatus for detecting materialsRIKEN·Filed 2004·Granted Apr 1, 2008·3 cites·5 claims
- 1058US6980010B2Method and apparatus for inspecting wire breaking of integrated circuitAISIN SEIKI·Filed 2004·Granted Dec 27, 2005·11 cites·2 claims
- 1157US9176008B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumADVANTEST CORP·Filed 2013·Granted Nov 3, 2015·0 cites·11 claims
- 1244US2004061055A1Method and apparatus for differential imaging using terahertz waveRIKEN·Filed 2003·Application pending·0 cites
- 1340US2010321682A1Holding fixture, placement method of holding fixture, and measurement methodADVANTEST CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →