Inventor · disambiguated record
Kouichi Nagai
Also filed as: NAGAI KOUICHI
81 granted patents·31 pending applications·425 citations·filing 1982–2023
99Inventor score
Files withFUJITSU SEMICONDUCTOR LTD32NAGAI KOUICHI16FUJITSU LTD15SHISEIDO CO LTD15FUJITSU MICROELECTRONICS LTD14
Top patents by PatentIndex Score
112 records- 0189US8921125B2Method of making ferroelectric memory device with barrier layer and novolac resin passivation layerNAGAI KOUICHI·Filed 2012·Granted Dec 30, 2014·9 cites·5 claims
- 0289US7598557B2Semiconductor device and method for fabricating a semicondutor device including first and second hydrogen diffusion preventing filmsFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 6, 2009·13 cites·24 claims
- 0388US7969008B2Semiconductor device with improved padsFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Jun 28, 2011·17 cites·20 claims
- 0486US8227337B2Semiconductor device having metal wirings of laminated structureKIKUCHI HIDEAKI·Filed 2010·Granted Jul 24, 2012·7 cites·9 claims
- 0586US4474859AThermal dye-transfer type recording sheetJUJO PAPER CO LTD·Filed 1982·Granted Oct 2, 1984·35 cites·7 claims
- 0685US8076780B2Semiconductor device with pads of enhanced moisture blocking abilitySAIGOH KAORU·Filed 2008·Granted Dec 13, 2011·12 cites·9 claims
- 0785US8076212B2Semiconductor device and method for manufacturing the sameTAKAHASHI MAKOTO·Filed 2010·Granted Dec 13, 2011·7 cites·6 claims
- 0885US7750485B2Semiconductor device and method for manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Jul 6, 2010·11 cites·10 claims
- 0984US7897414B2Method of manufacturing semiconductor device and thermal annealing apparatusFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Mar 1, 2011·7 cites·9 claims
- 1082US9305996B2Semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Apr 5, 2016·4 cites·7 claims
- 1182US7776622B2Method for fabricating semiconductor devicesFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Aug 17, 2010·7 cites·20 claims
- 1282US7288799B2Semiconductor device and fabrication method thereofFUJITSU LTD·Filed 2004·Granted Oct 30, 2007·32 cites·13 claims
- 1381US11413227B2Durable sunscreen cosmeticSHISEIDO CO LTD·Filed 2018·Granted Aug 16, 2022·2 cites·2 claims
- 1478US6815677B2Scanning electron microscope and method of controlling the sameFUJITSU LTD·Filed 2001·Granted Nov 9, 2004·13 cites·25 claims
- 1578US6075776AVLAN control system and methodNIPPON TELEGRAPH & TELEPHONE·Filed 1997·Granted Jun 13, 2000·146 cites·17 claims
- 1677US8956881B2Method of manufacturing a FeRAM deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Feb 17, 2015·3 cites·5 claims
- 1777US6653634B1Method of measuring length with scanning type electron microscopeHITACHI LTD·Filed 2000·Granted Nov 25, 2003·12 cites·11 claims
- 1876US7592656B2Semiconductor device and fabricating method of the sameFUJITSU LTD·Filed 2005·Granted Sep 22, 2009·6 cites·16 claims
- 1975US8212300B2Semiconductor deviceNAGAI KOUICHI·Filed 2009·Granted Jul 3, 2012·4 cites·9 claims
- 2074US8906705B2Semiconductor device with pads of enhanced moisture blocking abilitySAIGOH KAORU·Filed 2011·Granted Dec 9, 2014·3 cites·9 claims
- 2174US7592660B2Semiconductor device and method for manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Sep 22, 2009·4 cites·20 claims
- 2273US8247323B2Semiconductor deviceKIKUCHI HIDEAKI·Filed 2010·Granted Aug 21, 2012·3 cites·8 claims
- 2373US7598522B2Semiconductor substrate and production process thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Oct 6, 2009·5 cites·6 claims
- 2473US7186488B2Semiconductor device manufacturing method and semiconductor device manufacturing systemFUJITSU LTD·Filed 2005·Granted Mar 6, 2007·3 cites·18 claims
- 2572US8673657B2Semiconductor device including a circuit area and a monitor area having a plurality of monitor layers and method for manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2012·Granted Mar 18, 2014·2 cites·4 claims
- 2671US8466021B2Semiconductor device and manufacturing method thereofMIYAZAKI YUKIMASA·Filed 2012·Granted Jun 18, 2013·3 cites·6 claims
- 2769US8552484B2Semiconductor device and method for fabricating the sameNAGAI KOUICHI·Filed 2006·Granted Oct 8, 2013·4 cites·9 claims
- 2869US7768082B2Surface-shape sensor and method of manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Aug 3, 2010·4 cites·18 claims
- 2968US8343830B2Semiconductor device and method for manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Jan 1, 2013·3 cites·15 claims
- 3068US7915054B2Semiconductor device having a ferroelectric capacitorFUJITSU SEMICONDUCTOR LTD·Filed 2010·Granted Mar 29, 2011·2 cites·11 claims
- 3168US7683412B2Semiconductor device having a ferroelectric capacitatorFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 23, 2010·3 cites·7 claims
- 3267US8598045B2Semiconductor device and method for manufacturing the sameKIKUCHI HIDEAKI·Filed 2010·Granted Dec 3, 2013·2 cites·1 claims
- 3365US9059033B2Semiconductor device with pads of enhanced moisture blocking abilityFUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Jun 16, 2015·1 cites·11 claims
- 3465US8294230B2Surface profile sensor and method for manufacturing the sameYAMAGATA TAKAHIRO·Filed 2009·Granted Oct 23, 2012·4 cites·12 claims
- 3565US8237264B2Method of manufacturing semiconductor device and thermal annealing apparatusNAGAI KOUICHI·Filed 2011·Granted Aug 7, 2012·1 cites·7 claims
- 3664US8241980B2Semiconductor device and manufacturing method thereofMIYAZAKI YUKIMASA·Filed 2009·Granted Aug 14, 2012·3 cites·33 claims
- 3764US7880302B2Semiconductor device having metal wirings of laminated structureFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Feb 1, 2011·1 cites·7 claims
- 3863US8274152B2Semiconductor device having a contact hole extending from an upper surface of an insulating film and reaching one of a plurality of impurity regions constituting a transistor and method of manufacturing the sameNAGAI KOUICHI·Filed 2006·Granted Sep 25, 2012·2 cites·4 claims
- 3963US8008189B2Semiconductor device manufacturing method, semiconductor device, and semiconductor wafer structureFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Aug 30, 2011·1 cites·17 claims
- 4061US8629055B2Manufacturing method of semiconductor deviceSATO TSUKASA·Filed 2009·Granted Jan 14, 2014·2 cites·20 claims
- 4161US7652377B2Semiconductor device and manufacturing method of the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jan 26, 2010·2 cites·19 claims
- 4261US2023142992A1Thickener for non-aqueous compositionsSHISEIDO CO LTD·Filed 2023·Application pending·0 cites
- 4360US11638686B2Cosmetic preparationSHISEIDO CO LTD·Filed 2019·Granted May 2, 2023·0 cites·3 claims
- 4460US11474038B2Method for evaluating protective effect against external damage to skinSHISEIDO CO LTD·Filed 2019·Granted Oct 18, 2022·0 cites·16 claims
- 4560US7829476B2Method of manufacturing semiconductor device and semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Nov 9, 2010·1 cites·6 claims
- 4659US7629636B2Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Dec 8, 2009·1 cites·10 claims
- 4758US12419814B2Emulsion cosmeticSHISEIDO CO LTD·Filed 2019·Granted Sep 23, 2025·0 cites·15 claims
- 4858US8658493B2Manufacturing method of semiconductor deviceNAGAI KOUICHI·Filed 2009·Granted Feb 25, 2014·1 cites·14 claims
- 4958US8425226B2Heat treatment apparatus and method of manufacturing semiconductor deviceNAGAI KOUICHI·Filed 2009·Granted Apr 23, 2013·0 cites·7 claims
- 5058US8004030B2Semiconductor device and method for manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Aug 23, 2011·1 cites·20 claims
Showing the top 50 of 112 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →