Inventor · disambiguated record
Kouji Nishio
Also filed as: NISHIO KOUJI
14 granted patents·1 pending application·238 citations·filing 1987–2006
93Inventor score
Top patents by PatentIndex Score
15 records- 0169US7261416B2Eye's optical characteristics measuring systemTOPCON CORP·Filed 2006·Granted Aug 28, 2007·7 cites·9 claims
- 0260US7244025B2Eye's optical characteristics measuring systemTOPCON CORP·Filed 2006·Granted Jul 17, 2007·1 cites·8 claims
- 0360US5183044ANoncontact type tonometerTOPCON CORP·Filed 1991·Granted Feb 2, 1993·89 cites·6 claims
- 0440US5436679AApparatus for observing and photographing a corneal endotheliumTOPCON CORP·Filed 1992·Granted Jul 25, 1995·29 cites·19 claims
- 0540US4995393AAlignment apparatus of noncontact type tonometerTOPCON CORP·Filed 1989·Granted Feb 26, 1991·21 cites·7 claims
- 0637US2006030229A1Blended woven or knitted fabrics containing polyerethane elastic fibers and process for the production thereofFUKUOKA KUNIHIRO·Filed 2003·Application pending·0 cites
- 0735US5381194AApparatus for photographing a corneal endotheliumTOPCON CORP·Filed 1993·Granted Jan 10, 1995·20 cites·7 claims
- 0835US5092334ANoncontact type tonometerTOKYO OPTICAL·Filed 1988·Granted Mar 3, 1992·12 cites·3 claims
- 0935US5033841AOphthalmological instrumentTOPCON CORP·Filed 1989·Granted Jul 23, 1991·14 cites·3 claims
- 1034US6164778ACorneal endothelial cell photographing apparatusTOPCON CORP·Filed 1999·Granted Dec 26, 2000·16 cites·7 claims
- 1131US5430507AOphthalmologic apparatusTOPCON CORP·Filed 1993·Granted Jul 4, 1995·11 cites·11 claims
- 1230US5042483ANoncontact type tonometerTOPCON CORP·Filed 1990·Granted Aug 27, 1991·8 cites·9 claims
- 1330US4872460ANoncontact type tonometerTOKYO OPTICAL·Filed 1987·Granted Oct 10, 1989·5 cites·7 claims
- 1429US6234630B1Corneal endothelial cell measuring instrumentTOPCON CORP·Filed 1999·Granted May 22, 2001·2 cites·4 claims
- 1529US5621488AApparatus for imaging and diagnosing a corneaTOPCON CORP·Filed 1995·Granted Apr 15, 1997·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →