Inventor · disambiguated record
Koshi Ueda
Also filed as: UEDA KOSHI
7 granted patents·174 citations·filing 1994–1997
88Inventor score
Top patents by PatentIndex Score
7 records- 0183US5640539AIC analysis system having charged particle beam apparatus for improved contrast imageADVANTEST CORP·Filed 1994·Granted Jun 17, 1997·58 cites·9 claims
- 0276US5780859AElectrostatic-magnetic lens arrangementACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Jul 14, 1998·30 cites·22 claims
- 0371US5528156AIC analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1994·Granted Jun 18, 1996·27 cites·4 claims
- 0463US5895917ADetector objective lensACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Apr 20, 1999·17 cites·27 claims
- 0554US5592099AIC tester joined with ion beam tester and the detection method of the failure part of ICADVANTEST CORP·Filed 1995·Granted Jan 7, 1997·20 cites·5 claims
- 0649US5589780AIC Analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1994·Granted Dec 31, 1996·11 cites·8 claims
- 0747US5633595AIC analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1995·Granted May 27, 1997·11 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →