Inventor · disambiguated record
Krishna Rao
Also filed as: RAO KRISHNA · RAO KRISHNA R
9 granted patents·2 pending applications·80 citations·filing 2014–2023
85Inventor score
Top patents by PatentIndex Score
11 records- 0196US9087176B1Statistical overlay error prediction for feed forward and feedback correction of overlay errors, root cause analysis and process controlKLA TENCOR CORP·Filed 2014·Granted Jul 21, 2015·57 cites·20 claims
- 0289US10650508B2Automatic defect classification without sampling and feature selectionKLA TENCOR CORP·Filed 2015·Granted May 12, 2020·12 cites·20 claims
- 0383US9707660B2Predictive wafer modeling based focus error prediction using correlations of wafersKLA TENCOR CORP·Filed 2014·Granted Jul 18, 2017·4 cites·28 claims
- 0481US11861635B1Automatic analysis of regional housing markets based on the appreciation or depreciation of individual homesMFTB HOLDCO INC·Filed 2019·Granted Jan 2, 2024·2 cites·23 claims
- 0579US11861747B1Time on market and likelihood of sale predictionZILLOW INC·Filed 2017·Granted Jan 2, 2024·3 cites·32 claims
- 0673US10545412B2Statistical overlay error prediction for feed forward and feedback correction of overlay errors, root cause analysis and process controlKLA TENCOR CORP·Filed 2015·Granted Jan 28, 2020·2 cites·18 claims
- 0770US12482015B2Automatic analysis of regional housing markets based on the appreciation or depreciation of individual homesMFTB HOLDCO INC·Filed 2023·Granted Nov 25, 2025·0 cites·20 claims
- 0866US2024153020A1Time on market and likelihood of sale predictionMFTB HOLDCO INC·Filed 2023·Application pending·0 cites
- 0956US11456194B2Determining critical parameters using a high-dimensional variable selection modelKLA TENCOR CORP·Filed 2019·Granted Sep 27, 2022·0 cites·10 claims
- 1050US10361105B2Determining critical parameters using a high-dimensional variable selection modelKLA TENCOR CORP·Filed 2015·Granted Jul 23, 2019·0 cites·11 claims
- 1148US2022230485A1Vehicular control system with failure mode analysisMAGNA ELECTRONICS INC·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →