Inventor · disambiguated record
Kuan-Yu Fu
Also filed as: FU KUAN-YU
21 granted patents·301 citations·filing 1998–2002
96Inventor score
Files withUNITED MICROELECTRONICS CORP21
Top patents by PatentIndex Score
21 records- 0175US6268269B1Method for fabricating an oxide layer on silicon with carbon ions introduced at the silicon/oxide interface in order to reduce hot carrier effectsUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 31, 2001·39 cites·22 claims
- 0272US5990519AElectrostatic discharge structureUNITED MICROELECTRONICS CORP·Filed 1998·Granted Nov 23, 1999·41 cites·16 claims
- 0370US5963831AMethod of making an interconnect structure employing equivalent resistance paths to improve electromigration resistanceUNITED MICROELECTRONICS CORP·Filed 1999·Granted Oct 5, 1999·39 cites·4 claims
- 0467US6064095ALayout design of electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted May 16, 2000·26 cites·20 claims
- 0565US6033959AMethod of fabricating a multiple T-gate MOSFET deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Mar 7, 2000·18 cites·7 claims
- 0661US6052311AElectrically erasable programmable read only flash memoryUNITED MICROELECTRONICS CORP·Filed 1998·Granted Apr 18, 2000·20 cites·11 claims
- 0755US6080658ADevice protection structure for preventing plasma charging damage and vertical cross talkUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 27, 2000·20 cites·6 claims
- 0855US6063674AMethod for forming high voltage deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted May 16, 2000·15 cites·6 claims
- 0953US6368911B2Method for manufacturing a buried gateUNITED MICROELECTRONICS CORP·Filed 1998·Granted Apr 9, 2002·14 cites·20 claims
- 1047US7307311B2MOSFET deviceUNITED MICROELECTRONICS CORP·Filed 2002·Granted Dec 11, 2007·2 cites·3 claims
- 1145US6436798B2MOSFET deviceUNITED MICROELECTRONICS CORP·Filed 1999·Granted Aug 20, 2002·7 cites·18 claims
- 1243US6184122B1Method for preventing crosstalk between conductive layersUNITED MICROELECTRONICS CORP·Filed 1998·Granted Feb 6, 2001·11 cites·8 claims
- 1343US5864157AFlash memory with improved programming speedUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 26, 1999·8 cites·11 claims
- 1442US6255696B1Retrograde ESD protection apparatusUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 3, 2001·7 cites·12 claims
- 1538US6350626B1Method of testing electromigration lifetimeUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 26, 2002·9 cites·9 claims
- 1637US6084458ABi-directional transistor structureUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jul 4, 2000·4 cites·5 claims
- 1736US6052269AElectrostatic discharge protection circuit using point dischargeUNITED MICROELECTRONICS CORP·Filed 1999·Granted Apr 18, 2000·6 cites·14 claims
- 1833US6269315B1Reliability testing method of dielectric thin filmUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 31, 2001·5 cites·12 claims
- 1933US6249139B1Lifetime measurement of an ultra-thin dielectric layerUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 19, 2001·5 cites·5 claims
- 2033US5959360AInterconnect structure employing equivalent resistance paths to improve electromigration resistanceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 28, 1999·3 cites·3 claims
- 2131US6289291B1Statistical method of monitoring gate oxide layer yieldUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 11, 2001·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →