Inventor · disambiguated record
Kuong Hua Hii
Also filed as: HII KUONG H · HII KUONG HUA
12 granted patents·1 pending application·389 citations·filing 1997–2006
93Inventor score
Files withTEXAS INSTRUMENTS INC12
Top patents by PatentIndex Score
13 records- 0188US6801461B2Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 5, 2004·39 cites·42 claims
- 0287US5883843ABuilt-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 1997·Granted Mar 16, 1999·68 cites·6 claims
- 0381US6014336ATest enable control for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 11, 2000·47 cites·55 claims
- 0473US7328388B2Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 2006·Granted Feb 5, 2008·4 cites·6 claims
- 0571US5923599AApparatus and method for subarray testing in dynamic random access memories using a built-in-self-test unitTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 13, 1999·30 cites·12 claims
- 0670US7278078B2Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 2, 2007·12 cites·19 claims
- 0769US6353563B1Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 1999·Granted Mar 5, 2002·55 cites·43 claims
- 0867US5936900AIntegrated circuit memory device having built-in self test circuit with monitor and tester modesTEXAS INSTRUMENTS INC·Filed 1997·Granted Aug 10, 1999·31 cites·15 claims
- 0964US5875153AInternal/external clock option for built-in self testTEXAS INSTRUMENTS INC·Filed 1998·Granted Feb 23, 1999·43 cites·12 claims
- 1062US5991213AShort disturb test algorithm for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Nov 23, 1999·29 cites·23 claims
- 1159US5953272AData invert jump instruction test for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 14, 1999·18 cites·10 claims
- 1252US5959912AROM embedded mask release number for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 28, 1999·13 cites·2 claims
- 1333US2002071325A1Built-in self-test arrangement for integrated circuit memory devicesFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →