Inventor · disambiguated record
Kuo-Hua Hsieh
Also filed as: HSIEH KUO-HUA
1 granted patent·2 pending applications·16 citations·filing 2000–2023
37Inventor score
Top patents by PatentIndex Score
3 records- 0160US6483334B1Method for reliability testing of semiconductor ICUNITED MICROELECTRONICS CORP·Filed 2000·Granted Nov 19, 2002·16 cites·17 claims
- 0244US2024096733A1Package structure and method for fabricating the sameWISTRON NEWEB CORP·Filed 2023·Application pending·0 cites
- 0340US2024055385A1Package structure and method for fabricating the sameWISTRON NEWEB CORP·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →