Inventor · disambiguated record
Kuniko Kikuta
Also filed as: KIKUTA KUNIKO
28 granted patents·2 pending applications·233 citations·filing 1990–2016
96Inventor score
Top patents by PatentIndex Score
30 records- 0191US7202567B2Semiconductor device and manufacturing method for the sameNEC ELECTRONICS CORP·Filed 2005·Granted Apr 10, 2007·20 cites·15 claims
- 0277US5691571ASemiconductor device having fine contact hole with high aspect ratioNEC CORP·Filed 1995·Granted Nov 25, 1997·48 cites·6 claims
- 0376US7663207B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2006·Granted Feb 16, 2010·7 cites·20 claims
- 0473US7239002B2Integrated circuit deviceNEC CORP·Filed 2005·Granted Jul 3, 2007·6 cites·20 claims
- 0572US7554158B2Semiconductor device having analog and digital circuitsNEC ELECTRONICS CORP·Filed 2006·Granted Jun 30, 2009·5 cites·11 claims
- 0671US7494867B2Semiconductor device having MIM capacitive elements and manufacturing method for the sameNEC ELECTRONICS CORP·Filed 2007·Granted Feb 24, 2009·4 cites·3 claims
- 0769US7705422B2Semiconductor device including metal-insulator-metal capacitor arrangementNEC ELECTRONICS CORP·Filed 2005·Granted Apr 27, 2010·3 cites·6 claims
- 0866US6818991B1Copper-alloy interconnection layerNEC ELECTRONICS CORP·Filed 2000·Granted Nov 16, 2004·13 cites·24 claims
- 0962US6746875B2Magnetic memory and method of its manufactureNEC ELECTRONICS CORP·Filed 2002·Granted Jun 8, 2004·8 cites·21 claims
- 1061US6235583B1Non-volatile semiconductor memory and fabricating method thereforNEC CORP·Filed 1999·Granted May 22, 2001·23 cites·6 claims
- 1158US6633057B2Non-volatile semiconductor memory and fabricating method thereforNEC ELECTRONICS CORP·Filed 2001·Granted Oct 14, 2003·7 cites·8 claims
- 1258US6417533B2Semiconductor device having capacitor which assures sufficient capacity without requiring large space and method of producing the sameNEC CORP·Filed 2001·Granted Jul 9, 2002·7 cites·7 claims
- 1357US7154158B2Semiconductor device having MIM structure resistorNEC ELECTRONICS CORP·Filed 2004·Granted Dec 26, 2006·7 cites·15 claims
- 1456US6313030B1Method of making a conductive layer covering a hole of decreasing diameter in an insulation layer in a semiconductor deviceNEC CORP·Filed 2000·Granted Nov 6, 2001·6 cites·12 claims
- 1553US7432170B2Semiconductor device and fabrication method thereofNEC ELECTRONICS CORP·Filed 2004·Granted Oct 7, 2008·5 cites·8 claims
- 1653US6605507B2Non-volatile semiconductor memory device and manufacturing method thereofNEC ELECTRONICS CORP·Filed 2002·Granted Aug 12, 2003·4 cites·4 claims
- 1752US4983534ASemiconductor device and method of manufacturing the sameNEC CORP·Filed 1990·Granted Jan 8, 1991·14 cites·16 claims
- 1851US8378454B2Semiconductor device including metal-insulator-metal capacitor arrangementRENESAS ELECTRONICS CORP·Filed 2011·Granted Feb 19, 2013·0 cites·6 claims
- 1951US6437394B1Non-volatile semiconductor memory device with reduced line resistance and method of manufacturingNEC CORP·Filed 1999·Granted Aug 20, 2002·9 cites·5 claims
- 2049US7986026B2Semiconductor device including metal-insulator-metal capacitor arrangementRENESAS ELECTRONICS CORP·Filed 2010·Granted Jul 26, 2011·0 cites·5 claims
- 2149US6051880ABase layer structure covering a hole of decreasing diameter in an insulation layer in a semiconductor deviceNEC CORP·Filed 1998·Granted Apr 18, 2000·13 cites·25 claims
- 2246US7477538B2Magnetic random access memoryNEC CORP·Filed 2004·Granted Jan 13, 2009·4 cites·13 claims
- 2343US10276390B2Method and apparatus for reducing threshold voltage mismatch in an integrated circuitGLOBALFOUNDRIES INC·Filed 2016·Granted Apr 30, 2019·0 cites·16 claims
- 2442US6114244AMethod for manufacturing a semiconductor device having fine contact hole with high aspect ratioNEC CORP·Filed 1997·Granted Sep 5, 2000·9 cites·21 claims
- 2541US7777288B2Integrated circuit device and fabrication method thereforNEC ELECTRONICS CORP·Filed 2005·Granted Aug 17, 2010·0 cites·21 claims
- 2641US6359329B1Embedded wiring structure and method for forming the sameNEC CORP·Filed 1999·Granted Mar 19, 2002·9 cites·13 claims
- 2741US6352468B2Lapping method and method for manufacturing lapping particles for use in the lapping methodNEC CORP·Filed 2001·Granted Mar 5, 2002·0 cites·5 claims
- 2840US2006261425A1Magnetic memory and method of manufacturing the memoryNEC CORP·Filed 2003·Application pending·0 cites
- 2938US2002149083A1Semiconductor device having capacitor which assures sufficient capacity without requiring large space and method of producing the sameFiled 2002·Application pending·0 cites
- 3032US6257960B1Lapping method and method for manufacturing lapping particles for use in the lapping methodNEC CORP·Filed 1999·Granted Jul 10, 2001·2 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →