Inventor · disambiguated record
Kulpreet Singh Virdi
Also filed as: VIRDI KULPREET SINGH
4 granted patents·2 pending applications·2 citations·filing 2017–2021
58Inventor score
Files withAPPLIED MATERIALS INC6
Top patents by PatentIndex Score
6 records- 0179US10345250B2Method of inspecting a sample with a charged particle beam device, and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2017·Granted Jul 9, 2019·2 cites·19 claims
- 0265US11610755B2Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sampleAPPLIED MATERIALS INC·Filed 2021·Granted Mar 21, 2023·0 cites·22 claims
- 0355US11195691B2Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sampleAPPLIED MATERIALS INC·Filed 2019·Granted Dec 7, 2021·0 cites·21 claims
- 0434US2020118786A1System and method for selective autofocusAPPLIED MATERIALS INC·Filed 2018·Application pending·0 cites
- 0533US2018364563A1Method and apparatus for inspecting a sampleAPPLIED MATERIALS INC·Filed 2017·Application pending·0 cites
- 0630US11687008B2Method for automated critical dimension measurement on a substrate for display manufacturing, method of inspecting a large area substrate for display manufacturing, apparatus for inspecting a large area substrate for display manufacturing and method of operating thereofAPPLIED MATERIALS INC·Filed 2018·Granted Jun 27, 2023·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Kulpreet Singh Virdi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →