Inventor · disambiguated record
Kuang-Chih Wang
Also filed as: WANG KUANG C · WANG KUANG-CHIH
11 granted patents·5 pending applications·413 citations·filing 1990–2006
93Inventor score
Files withUNITED MICROELECTRONICS CORP6LUR WATER2UNITED INTEGRATED CIRCUITS CORP2METRO TOY IND CO LTD1UNITED MICORELECTRONICS CORP1
Top patents by PatentIndex Score
16 records- 0197US7253095B2Air gap formation method for reducing undesired capacitive coupling between interconnects in an integrated circuit deviceUNITED MICROELECTRONICS CORP·Filed 2005·Granted Aug 7, 2007·59 cites·16 claims
- 0293US7138329B2Air gap for tungsten/aluminum plug applicationsUNITED MICROELECTRONICS CORP·Filed 2002·Granted Nov 21, 2006·74 cites·34 claims
- 0390US7449407B2Air gap for dual damascene applicationsUNITED MICROELECTRONICS CORP·Filed 2002·Granted Nov 11, 2008·59 cites·25 claims
- 0490US6917109B2Air gap structure and formation method for reducing undesired capacitive coupling between interconnects in an integrated circuit deviceUNITED MICORELECTRONICS CORP·Filed 2002·Granted Jul 12, 2005·61 cites·20 claims
- 0588US6743721B2Method and system for making cobalt silicideUNITED MICROELECTRONICS CORP·Filed 2002·Granted Jun 1, 2004·29 cites·12 claims
- 0674US6943110B1Wafer processing apparatus and methods for depositing cobalt silicideUNITED MICROELECTRONICS CORP·Filed 2003·Granted Sep 13, 2005·10 cites·23 claims
- 0768US5040319ASound sensitive toy assembly including reciprocating mechanismMETRO TOY IND CO LTD·Filed 1990·Granted Aug 20, 1991·35 cites·15 claims
- 0866US5604155AAl-based contact formation process using Ti glue layer to prevent nodule-induced bridgingWINBOND ELECTRONICS CORP·Filed 1995·Granted Feb 18, 1997·35 cites·3 claims
- 0965US6878627B1Semiconductor device with cobalt silicide contacts and method of making the sameUNITED MICROELECTRONICS CORP·Filed 2003·Granted Apr 12, 2005·6 cites·13 claims
- 1060US6066550AMethod of improving selectivity between silicon nitride and silicon oxideUNITED INTEGRATED CIRCUITS CORP·Filed 1998·Granted May 23, 2000·24 cites·17 claims
- 1155US6174813B1Dual damascene manufacturing processUNITED INTEGRATED CIRCUITS CORP·Filed 1998·Granted Jan 16, 2001·21 cites·20 claims
- 1252US2006014388A1Wafer processing apparatus & methods for depositing cobalt silicideLUR WATER·Filed 2005·Application pending·0 cites
- 1351US2005179139A1Semiconductor device with cobalt silicide contactsFiled 2005·Application pending·0 cites
- 1451US2005176248A1Semiconductor device with cobalt silicide contactsFiled 2005·Application pending·0 cites
- 1548US2007076339A1Air gap for tungsten/aluminum plug applicationsLUR WATER·Filed 2006·Application pending·0 cites
- 1643US2006240867A1Mobile phone with monitoring functions, monitoring system and monitoring method thereofWANG KUANG-CHIH·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →