Inventor · disambiguated record
L. Farnsworth
Also filed as: FARNSWORTH III L OWEN · FARNSWORTH L OWEN
6 granted patents·1 pending application·210 citations·filing 2000–2003
86Inventor score
Top patents by PatentIndex Score
7 records- 0192US6768694B2Method of electrically blowing fuses under control of an on-chip tester interface apparatusIBM·Filed 2002·Granted Jul 27, 2004·84 cites·44 claims
- 0284US6782501B2System for reducing test data volume in the testing of logic productsCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Aug 24, 2004·34 cites·18 claims
- 0382US6901542B2Internal cache for on chip test data storageIBM·Filed 2001·Granted May 31, 2005·35 cites·33 claims
- 0482US6708305B1Deterministic random LBISTIBM·Filed 2000·Granted Mar 16, 2004·29 cites·20 claims
- 0572US6996791B2Method for optimizing a set of scan diagnostic patternsIBM·Filed 2003·Granted Feb 7, 2006·22 cites·20 claims
- 0649US7010733B2Parametric testing for high pin count ASICIBM·Filed 2002·Granted Mar 7, 2006·6 cites·10 claims
- 0734US2004139377A1Method and apparatus for compact scan testingIBM·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →