Inventor · disambiguated record
Lawrence Lane
Also filed as: LANE LAWRENCE · LANE LAWRENCE J
14 granted patents·238 citations·filing 1975–2007
93Inventor score
Top patents by PatentIndex Score
14 records- 0191US7221989B2Optical metrology model optimization for process controlTOKYO ELECTRON LTD·Filed 2006·Granted May 22, 2007·18 cites·27 claims
- 0291US7065423B2Optical metrology model optimization for process controlTIMBRE TECH INC·Filed 2004·Granted Jun 20, 2006·58 cites·35 claims
- 0391US4855664AMethod and apparatus for damping oscillations of an ac generatorGEN ELECTRIC·Filed 1988·Granted Aug 8, 1989·61 cites·19 claims
- 0482US7395132B2Optical metrology model optimization for process controlTIMBRE TECH INC·Filed 2007·Granted Jul 1, 2008·11 cites·28 claims
- 0579US7216045B2Selection of wavelengths for integrated circuit optical metrologyTIMBRE TECH INC·Filed 2002·Granted May 8, 2007·22 cites·2 claims
- 0663US7394554B2Selecting a hypothetical profile to use in optical metrologyTIMBRE TECH INC·Filed 2003·Granted Jul 1, 2008·10 cites·32 claims
- 0759US4535377AShaft voltage suppression circuitGEN ELECTRIC·Filed 1984·Granted Aug 13, 1985·17 cites·9 claims
- 0855US3976868AVoltage synthesizationGEN ELECTRIC·Filed 1975·Granted Aug 24, 1976·10 cites·15 claims
- 0954US6608686B1Measurement of metal electroplating and seed layer thickness and profileTIMBRE TECH INC·Filed 2001·Granted Aug 19, 2003·6 cites·29 claims
- 1044US7474993B2Selection of wavelengths for integrated circuit optical metrologyTIMBRE TECH INC·Filed 2007·Granted Jan 6, 2009·0 cites·20 claims
- 1138US4999564APower system stabilizer system having improved integrity checking schemeGEN ELECTRIC·Filed 1989·Granted Mar 12, 1991·13 cites·17 claims
- 1235US5091690AMethod for monitoring operational condition of circuit componentsGEN ELECTRIC·Filed 1990·Granted Feb 25, 1992·8 cites·2 claims
- 1334US3971978AGenerator control systemGEN ELECTRIC·Filed 1975·Granted Jul 27, 1976·3 cites·8 claims
- 1428US4996519AMethod and apparatus for monitoring an amplifierGEN ELECTRIC·Filed 1989·Granted Feb 26, 1991·1 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →