Inventor · disambiguated record
Larre H. Nelson
Also filed as: NELSON LARRE · NELSON LARRE H
6 granted patents·2 pending applications·197 citations·filing 2002–2021
86Inventor score
Files withRIKA ELECTRONICS INTERNATIONAL4PARICON TECH CORPORATION2NELSON LARRE H1RIKA DENSHI AMERICA INC1
Top patents by PatentIndex Score
8 records- 0191US6685492B2Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational conditionRIKA ELECTRONICS INTERNATIONAL·Filed 2002·Granted Feb 3, 2004·68 cites·19 claims
- 0289US6992496B2Apparatus for interfacing electronic packages and test equipmentRIKA ELECTRONICS INTERNATIONAL·Filed 2003·Granted Jan 31, 2006·56 cites·29 claims
- 0388US7315176B2Electrical test probes, methods of making, and methods of usingRIKA DENSHI AMERICA INC·Filed 2005·Granted Jan 1, 2008·35 cites·22 claims
- 0478US9910069B1Biasing method and device construction for a spring probeNELSON LARRE H·Filed 2015·Granted Mar 6, 2018·3 cites·4 claims
- 0574US7362114B2Apparatus for interfacing electronic packages and test equipmentRIKA ELECTRONICS INTERNATIONAL·Filed 2004·Granted Apr 22, 2008·17 cites·17 claims
- 0671US6667629B2Electrical test probes and methods of making the sameRIKA ELECTRONICS INTERNATIONAL·Filed 2002·Granted Dec 23, 2003·18 cites·29 claims
- 0742US2022052012A1Compliant Electronic Component InterconnectionPARICON TECH CORPORATION·Filed 2021·Application pending·0 cites
- 0837US2021021072A1Spring Pin-Based Electrical Interconnect SystemPARICON TECH CORPORATION·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →