Inventor · disambiguated record
Lawrence Scipioni
Also filed as: SCIPIONI LAWRENCE
18 granted patents·2 pending applications·315 citations·filing 2000–2014
95Inventor score
Top patents by PatentIndex Score
20 records- 0197US7670455B2Magnetically enhanced, inductively coupled plasma source for a focused ion beam systemFEI CO·Filed 2007·Granted Mar 2, 2010·48 cites·30 claims
- 0296US7241361B2Magnetically enhanced, inductively coupled plasma source for a focused ion beam systemFEI CO·Filed 2004·Granted Jul 10, 2007·86 cites·20 claims
- 0395US8168957B2Magnetically enhanced, inductively coupled plasma source for a focused ion beam systemKELLER JOHN·Filed 2010·Granted May 1, 2012·34 cites·22 claims
- 0492US7544523B2Method of fabricating nanodevicesFEI CO·Filed 2006·Granted Jun 9, 2009·19 cites·35 claims
- 0591US9640367B2Plasma source for a focused ion beam systemFEI CO·Filed 2014·Granted May 2, 2017·9 cites·15 claims
- 0690US7601976B2Dual beam systemFEI CO·Filed 2006·Granted Oct 13, 2009·10 cites·22 claims
- 0789US8829468B2Magnetically enhanced, inductively coupled plasma source for a focused ion beam systemKELLER JOHN·Filed 2012·Granted Sep 9, 2014·8 cites·19 claims
- 0889US6727500B1System for imaging a cross-section of a substrateFEI CO·Filed 2000·Granted Apr 27, 2004·37 cites·23 claims
- 0988US7161159B2Dual beam systemFEI CO·Filed 2004·Granted Jan 9, 2007·22 cites·3 claims
- 1084US8013311B2Dual beam systemFEI CO·Filed 2009·Granted Sep 6, 2011·5 cites·9 claims
- 1178US6838668B2System for imaging a cross-section of a substrateFEI CO·Filed 2003·Granted Jan 4, 2005·14 cites·22 claims
- 1274US8399864B2Dual beam systemHILL RAYMOND·Filed 2011·Granted Mar 19, 2013·2 cites·7 claims
- 1370US7160475B2Fabrication of three dimensional structuresFEI CO·Filed 2002·Granted Jan 9, 2007·16 cites·7 claims
- 1466US8013300B2Sample decontaminationZEISS CARL NTS LLC·Filed 2009·Granted Sep 6, 2011·3 cites·19 claims
- 1565US8334701B2Repairing defectsKNIPPELMEYER RAINER·Filed 2009·Granted Dec 18, 2012·2 cites·24 claims
- 1657US2010136255A1Ice layers in charged particle systems and methodsCARL ZEISS SMT INC·Filed 2009·Application pending·0 cites
- 1747US8907277B2Reducing particle implantationKNIPPELMEYER RAINER·Filed 2009·Granted Dec 9, 2014·0 cites·25 claims
- 1846US8384029B2Cross-section systems and methodsZEISS CARL NTS LLC·Filed 2009·Granted Feb 26, 2013·0 cites·14 claims
- 1946US2011163068A1Multibeam SystemUTLAUT MARK·Filed 2009·Application pending·0 cites
- 2040US8455840B2Gas field ion microscopes having multiple operation modesSCIPIONI LAWRENCE·Filed 2011·Granted Jun 4, 2013·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →