Inventor · disambiguated record
Lee D. Clementi
Also filed as: CLEMENTI LEE D · CLEMENTI LEE DANTE
6 granted patents·2 pending applications·402 citations·filing 1992–2003
88Inventor score
Top patents by PatentIndex Score
8 records- 0193US6118525AWafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 1997·Granted Sep 12, 2000·122 cites·21 claims
- 0292US5712701ASurface inspection system and method of inspecting surface of workpieceADE OPTICAL SYST CORP·Filed 1995·Granted Jan 27, 1998·164 cites·42 claims
- 0389US6509965B2Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2001·Granted Jan 21, 2003·38 cites·16 claims
- 0471US6122047AMethods and apparatus for identifying the material of a particle occurring on the surface of a substrateADE OPTICAL SYST CORP·Filed 1999·Granted Sep 19, 2000·37 cites·32 claims
- 0553US5329351AParticle detection system with coincident detectionESTEK CORP·Filed 1992·Granted Jul 12, 1994·20 cites·25 claims
- 0648US6621581B1Method and apparatus for mapping surface topography of a substrateADE CORP·Filed 1999·Granted Sep 16, 2003·21 cites·18 claims
- 0742US2004085533A1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2003·Application pending·0 cites
- 0841US2003071992A1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →