Inventor · disambiguated record
Leendert Jan Karssemeijer
Also filed as: KARSSEMEIJER LEENDERT JAN
3 granted patents·2 pending applications·2 citations·filing 2018–2022
50Inventor score
Technology areasG03F
Files withASML NETHERLANDS BV5
Top patents by PatentIndex Score
5 records- 0191US12032299B2Metrology method and associated metrology and lithographic apparatusesASML NETHERLANDS BV·Filed 2020·Granted Jul 9, 2024·2 cites·25 claims
- 0260US12189314B2Metrology method and associated metrology and lithographic apparatusesASML NETHERLANDS BV·Filed 2021·Granted Jan 7, 2025·0 cites·20 claims
- 0356US12461457B2Asymmetry extended grid model for wafer alignmentASML NETHERLANDS BV·Filed 2022·Granted Nov 4, 2025·0 cites·20 claims
- 0443US2024118631A1Alignment method and associated alignment and lithographic apparatusesASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0538US2018239851A1Apparatus and method for inferring parameters of a model of a measurement structure for a patterning processASML NETHERLANDS BV·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →